跨年龄人脸识别的双解耦与多层次特征集成

IF 3 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Wentao Duan;Min Zhi;Ping Ping;Yuening Zhang;Xuanhao Qi;Wei Hu;Zhe Lian
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引用次数: 0

摘要

在跨年龄人脸识别领域,丰富面部特征的有效解耦是至关重要的。提出了一种新的跨年龄人脸识别策略,重点关注多层次特征的双重解耦,以优化身份相关特征的提取和处理。该方法首先通过卷积神经网络对人脸图像进行多层特征提取,获取一系列低维和高维混合特征,并将其有效整合。随后,将这些融合特征引入线性和非线性分解单元。在多任务训练的监督下,与个体身份相关的特征解耦。最后,利用提取的身份特征执行跨年龄人脸识别任务。在多个标准跨年龄人脸识别数据集和标准通用人脸识别数据集上进行了评估,结果表明该方法具有较高的准确率,在有效性和可泛化性方面具有显著优势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dual-Decoupling and Multi-Level Feature Integration for Cross-Age Face Recognition
Efficient decoupling of rich facial features is crucial in the realm of cross-age face recognition. A novel strategy for cross-age facial recognition is proposed, focusing on the dual decoupling of multilevel features to optimize the extraction and processing of identity-related features. The method begins with multilevel feature extraction on facial images through convolutional neural networks, acquiring a series of low-dimensional and high-dimensional hybrid features, which are then effectively integrated. Subsequently, these fused features are introduced into both linear and nonlinear decomposition units. Under the supervision of multitask training, features related to individual identities are decoupled. Finally, the extracted identity features are utilized to perform cross-age facial recognition tasks. When evaluated on multiple standard cross-age facial recognition datasets and standard universal facial recognition datasets, the method demonstrates high accuracy, highlighting its significant advantages in effectiveness and generalizability.
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来源期刊
Chinese Journal of Electronics
Chinese Journal of Electronics 工程技术-工程:电子与电气
CiteScore
3.70
自引率
16.70%
发文量
342
审稿时长
12.0 months
期刊介绍: CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.
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