{"title":"基于多向扫描的涡流检测空腔和裂纹识别","authors":"Zhengya Guo;Kok-Meng Lee;Yiwen Zhu;Zhenhua Xiong","doi":"10.1109/JSEN.2025.3593368","DOIUrl":null,"url":null,"abstract":"Motivated by the significant disparity in the aspect ratio of cavity and crack defects, this article proposes a multidirectional scanning-based eddy current (EC) testing strategy for distinguishing between these two types by analyzing the characteristics of the perturbed EC and the corresponding magnetic flux density (MFD) fields. To enable efficient simulation and verification of the strategy, the distributed current source (DCS) method is enhanced by incorporating solution domain rotation, allowing accurate modeling of defects at arbitrary orientations. A symmetrical relationship among scanning images is also discussed to reduce the number of required simulations. The validity of the improved numerical model is demonstrated by comparing it with finite element analysis (FEA) results. Simulated scanning images for various defect orientations are then used to identify a key parameter that enables reliable classification. Finally, the proposed strategy is experimentally validated using a testbed mounted on a servo-positioning platform, confirming its effectiveness even when applied to workpiece (WP) materials different from those used in the simulations.","PeriodicalId":447,"journal":{"name":"IEEE Sensors Journal","volume":"25 17","pages":"32436-32448"},"PeriodicalIF":4.3000,"publicationDate":"2025-08-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multidirectional Scanning-Based Eddy Current Testing for Cavity and Crack Discrimination\",\"authors\":\"Zhengya Guo;Kok-Meng Lee;Yiwen Zhu;Zhenhua Xiong\",\"doi\":\"10.1109/JSEN.2025.3593368\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Motivated by the significant disparity in the aspect ratio of cavity and crack defects, this article proposes a multidirectional scanning-based eddy current (EC) testing strategy for distinguishing between these two types by analyzing the characteristics of the perturbed EC and the corresponding magnetic flux density (MFD) fields. To enable efficient simulation and verification of the strategy, the distributed current source (DCS) method is enhanced by incorporating solution domain rotation, allowing accurate modeling of defects at arbitrary orientations. A symmetrical relationship among scanning images is also discussed to reduce the number of required simulations. The validity of the improved numerical model is demonstrated by comparing it with finite element analysis (FEA) results. Simulated scanning images for various defect orientations are then used to identify a key parameter that enables reliable classification. Finally, the proposed strategy is experimentally validated using a testbed mounted on a servo-positioning platform, confirming its effectiveness even when applied to workpiece (WP) materials different from those used in the simulations.\",\"PeriodicalId\":447,\"journal\":{\"name\":\"IEEE Sensors Journal\",\"volume\":\"25 17\",\"pages\":\"32436-32448\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2025-08-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Sensors Journal\",\"FirstCategoryId\":\"103\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11112538/\",\"RegionNum\":2,\"RegionCategory\":\"综合性期刊\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Journal","FirstCategoryId":"103","ListUrlMain":"https://ieeexplore.ieee.org/document/11112538/","RegionNum":2,"RegionCategory":"综合性期刊","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Multidirectional Scanning-Based Eddy Current Testing for Cavity and Crack Discrimination
Motivated by the significant disparity in the aspect ratio of cavity and crack defects, this article proposes a multidirectional scanning-based eddy current (EC) testing strategy for distinguishing between these two types by analyzing the characteristics of the perturbed EC and the corresponding magnetic flux density (MFD) fields. To enable efficient simulation and verification of the strategy, the distributed current source (DCS) method is enhanced by incorporating solution domain rotation, allowing accurate modeling of defects at arbitrary orientations. A symmetrical relationship among scanning images is also discussed to reduce the number of required simulations. The validity of the improved numerical model is demonstrated by comparing it with finite element analysis (FEA) results. Simulated scanning images for various defect orientations are then used to identify a key parameter that enables reliable classification. Finally, the proposed strategy is experimentally validated using a testbed mounted on a servo-positioning platform, confirming its effectiveness even when applied to workpiece (WP) materials different from those used in the simulations.
期刊介绍:
The fields of interest of the IEEE Sensors Journal are the theory, design , fabrication, manufacturing and applications of devices for sensing and transducing physical, chemical and biological phenomena, with emphasis on the electronics and physics aspect of sensors and integrated sensors-actuators. IEEE Sensors Journal deals with the following:
-Sensor Phenomenology, Modelling, and Evaluation
-Sensor Materials, Processing, and Fabrication
-Chemical and Gas Sensors
-Microfluidics and Biosensors
-Optical Sensors
-Physical Sensors: Temperature, Mechanical, Magnetic, and others
-Acoustic and Ultrasonic Sensors
-Sensor Packaging
-Sensor Networks
-Sensor Applications
-Sensor Systems: Signals, Processing, and Interfaces
-Actuators and Sensor Power Systems
-Sensor Signal Processing for high precision and stability (amplification, filtering, linearization, modulation/demodulation) and under harsh conditions (EMC, radiation, humidity, temperature); energy consumption/harvesting
-Sensor Data Processing (soft computing with sensor data, e.g., pattern recognition, machine learning, evolutionary computation; sensor data fusion, processing of wave e.g., electromagnetic and acoustic; and non-wave, e.g., chemical, gravity, particle, thermal, radiative and non-radiative sensor data, detection, estimation and classification based on sensor data)
-Sensors in Industrial Practice