使用混合投影和质心算法进行离焦校正和降噪。

IF 1.9 4区工程技术 Q3 MICROSCOPY

Journal of microscopy Pub Date : 2025-08-21 DOI:10.1111/jmi.70010

Zhiyuan Ding, Chen Huang, Adrián Pedrazo-Tardajos, Angus I Kirkland, Peter D Nellist

{"title":"使用混合投影和质心算法进行离焦校正和降噪。","authors":"Zhiyuan Ding, Chen Huang, Adrián Pedrazo-Tardajos, Angus I Kirkland, Peter D Nellist","doi":"10.1111/jmi.70010","DOIUrl":null,"url":null,"abstract":"Integrated Centre-of-Mass (iCOM) is a widely used phase-contrast imaging method based on Centre-of-Mass (COM), which makes use of a 4D Scanning Transmission Electron Microscopy (STEM) dataset using an in-focus probe. In this paper, we introduce a novel approach that combines Single-Side Band (SSB) ptychography with COM and iCOM, termed Side Band masked Centre-of-Mass (SBm-COM) and integrated Centre-of-Mass (SBm-iCOM) which is applicable to weak-phase objects. This method compensates for residual aberrations in 4DSTEM datasets while also reducing the noise contribution up to the <math> <semantics><mrow><mn>2</mn> <mi>α</mi></mrow> <annotation>$2\\alpha $</annotation></semantics> </math> resolution limit. The aberration compensation and noise filtering features make the SBm-(i)COM suitable for samples that are difficult to focus or those that require minimal electron fluence. SBm-iCOM transfers the same information as SSB ptychography but results in an intrinsic transfer function that enhances low-frequency information.","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":" ","pages":""},"PeriodicalIF":1.9000,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Defocus correction and noise reduction using a hybrid ptychography and Centre-of-Mass algorithm.\",\"authors\":\"Zhiyuan Ding, Chen Huang, Adrián Pedrazo-Tardajos, Angus I Kirkland, Peter D Nellist\",\"doi\":\"10.1111/jmi.70010\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Integrated Centre-of-Mass (iCOM) is a widely used phase-contrast imaging method based on Centre-of-Mass (COM), which makes use of a 4D Scanning Transmission Electron Microscopy (STEM) dataset using an in-focus probe. In this paper, we introduce a novel approach that combines Single-Side Band (SSB) ptychography with COM and iCOM, termed Side Band masked Centre-of-Mass (SBm-COM) and integrated Centre-of-Mass (SBm-iCOM) which is applicable to weak-phase objects. This method compensates for residual aberrations in 4DSTEM datasets while also reducing the noise contribution up to the <math> <semantics><mrow><mn>2</mn> <mi>α</mi></mrow> <annotation>$2\\\\alpha $</annotation></semantics> </math> resolution limit. The aberration compensation and noise filtering features make the SBm-(i)COM suitable for samples that are difficult to focus or those that require minimal electron fluence. SBm-iCOM transfers the same information as SSB ptychography but results in an intrinsic transfer function that enhances low-frequency information.\",\"PeriodicalId\":16484,\"journal\":{\"name\":\"Journal of microscopy\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-08-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of microscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1111/jmi.70010\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of microscopy","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1111/jmi.70010","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MICROSCOPY","Score":null,"Total":0}

引用次数: 0

摘要

集成质心（iCOM）是一种广泛使用的基于质心（COM）的相对比成像方法，它利用了一个聚焦探针的四维扫描透射电子显微镜（STEM）数据集。本文介绍了一种将单侧带（SSB）平面成像与COM和iCOM相结合的新方法，称为单侧带屏蔽质心（SBm-COM）和集成质心（SBm-iCOM），适用于弱相位目标。该方法补偿了4DSTEM数据集中的残余像差，同时还将噪声贡献降低到2 α $2\alpha $分辨率限制。像差补偿和噪声滤波特性使SBm-(i)COM适用于难以聚焦或需要最小电子影响的样品。SBm-iCOM传递与SSB型图相同的信息，但产生一个增强低频信息的内在传递函数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Defocus correction and noise reduction using a hybrid ptychography and Centre-of-Mass algorithm.

Integrated Centre-of-Mass (iCOM) is a widely used phase-contrast imaging method based on Centre-of-Mass (COM), which makes use of a 4D Scanning Transmission Electron Microscopy (STEM) dataset using an in-focus probe. In this paper, we introduce a novel approach that combines Single-Side Band (SSB) ptychography with COM and iCOM, termed Side Band masked Centre-of-Mass (SBm-COM) and integrated Centre-of-Mass (SBm-iCOM) which is applicable to weak-phase objects. This method compensates for residual aberrations in 4DSTEM datasets while also reducing the noise contribution up to the $2 α$ resolution limit. The aberration compensation and noise filtering features make the SBm-(i)COM suitable for samples that are difficult to focus or those that require minimal electron fluence. SBm-iCOM transfers the same information as SSB ptychography but results in an intrinsic transfer function that enhances low-frequency information.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Journal of microscopy 工程技术-显微镜技术

CiteScore

4.30

自引率

5.00%

发文量

审稿时长

1 months

期刊介绍： The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.