{"title":"源同步接口的可编程延迟链","authors":"Jen-Chieh Liu, Jun-Yu Chen, Wen-Qi Liu","doi":"10.1016/j.vlsi.2025.102517","DOIUrl":null,"url":null,"abstract":"<div><div>This paper describes a 5 ps timing resolution programmable delay chain (PDC) comprising a coarse-tuning delay line (CT-DL) and fine-timing delay line (FT-DL) to enable the user to adjust the delay time. For the process, voltage and temperature variations (PVT variations), the digital delay-locked loop (Digital DLL), and the auto-calibration circuit ensure that the programmable delay time is constant. The CT-DL and FT-DL adjust the delay time with a 5 ps delay time interval, employing a MUX-based scheme and the MOS varactor to define the delay tuning range and timing resolution. The CT-DL's timing resolution is determined via the DLL's one delay cell, with the FT-DL using an auto-calibration circuit to maintain a constant timing resolution. Thus, the PDC achieves a programmable delay time under the PVT variations. The test chip was implemented in a 90 nm CMOS process and a maximum operating frequency of 1 GHz. The power consumption was less than 505 μW when the PDC input was 100 MHz and the delay time range was 1.5 ns with a resolution and average accuracy of 5 ps and ±0.29 LSB, respectively.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"105 ","pages":"Article 102517"},"PeriodicalIF":2.5000,"publicationDate":"2025-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A programmable delay chain for the source-synchronous interface\",\"authors\":\"Jen-Chieh Liu, Jun-Yu Chen, Wen-Qi Liu\",\"doi\":\"10.1016/j.vlsi.2025.102517\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>This paper describes a 5 ps timing resolution programmable delay chain (PDC) comprising a coarse-tuning delay line (CT-DL) and fine-timing delay line (FT-DL) to enable the user to adjust the delay time. For the process, voltage and temperature variations (PVT variations), the digital delay-locked loop (Digital DLL), and the auto-calibration circuit ensure that the programmable delay time is constant. The CT-DL and FT-DL adjust the delay time with a 5 ps delay time interval, employing a MUX-based scheme and the MOS varactor to define the delay tuning range and timing resolution. The CT-DL's timing resolution is determined via the DLL's one delay cell, with the FT-DL using an auto-calibration circuit to maintain a constant timing resolution. Thus, the PDC achieves a programmable delay time under the PVT variations. The test chip was implemented in a 90 nm CMOS process and a maximum operating frequency of 1 GHz. The power consumption was less than 505 μW when the PDC input was 100 MHz and the delay time range was 1.5 ns with a resolution and average accuracy of 5 ps and ±0.29 LSB, respectively.</div></div>\",\"PeriodicalId\":54973,\"journal\":{\"name\":\"Integration-The Vlsi Journal\",\"volume\":\"105 \",\"pages\":\"Article 102517\"},\"PeriodicalIF\":2.5000,\"publicationDate\":\"2025-08-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Integration-The Vlsi Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167926025001749\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025001749","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A programmable delay chain for the source-synchronous interface
This paper describes a 5 ps timing resolution programmable delay chain (PDC) comprising a coarse-tuning delay line (CT-DL) and fine-timing delay line (FT-DL) to enable the user to adjust the delay time. For the process, voltage and temperature variations (PVT variations), the digital delay-locked loop (Digital DLL), and the auto-calibration circuit ensure that the programmable delay time is constant. The CT-DL and FT-DL adjust the delay time with a 5 ps delay time interval, employing a MUX-based scheme and the MOS varactor to define the delay tuning range and timing resolution. The CT-DL's timing resolution is determined via the DLL's one delay cell, with the FT-DL using an auto-calibration circuit to maintain a constant timing resolution. Thus, the PDC achieves a programmable delay time under the PVT variations. The test chip was implemented in a 90 nm CMOS process and a maximum operating frequency of 1 GHz. The power consumption was less than 505 μW when the PDC input was 100 MHz and the delay time range was 1.5 ns with a resolution and average accuracy of 5 ps and ±0.29 LSB, respectively.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.