白光照射下纳米级人工制品干涉图像的光学鉴定

IF 0.9 4区 物理与天体物理 Q4 OPTICS
Naoya Tate, Kohei Kobayashi, Morihisa Hoga, Mitsuru Kitamura, Mikio Ishikawa, Naoki Yoshida, Tsutomu Matsumoto
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引用次数: 0

摘要

在物联网时代,连接互联网的边缘设备的物理安全框架必不可少。因此,强烈要求更高的安全性和更高的真实性,以防止未经授权的非法入侵。另一方面,包含纳米级结构的人工制品比一般技术的制造分辨率要小,在技术上很难复制。因此,可以考虑向每个边缘设备或其组件添加此类工件,以确保安全性和真实性,因为纳米级工件度量是基于其更高的克隆抗性自定义的。然而,读取和评估这些工件的物理身份需要使用先进的设置和技术。因此,在广泛的实际应用中,它们不是首选。在这项研究中,我们提出并展示了一种光学方法,作为基于更简单的设置和技术的纳米级物理身份的另一种读出方法。此外,还定量验证了利用纳米级伪物身份进行实验鉴定的性能。我们的实验装置通过遵循白光干涉测量传感来操作。一般来说,白光干涉法通过精确地改变目标与检测装置之间的距离来获得大量干涉图像,从而重建出具有纳米级分辨率的高度分布图像。然而,在我们的应用中,不一定需要重建高度分布图像,而期望将单个干涉图像定义为目标伪像的身份。随后,利用一定的干扰图像计算伪匹配率和不匹配率,定性评价所提方法的认证性能。此外,实验研究了干涉图像的空间分辨率和相应的数据大小对其性能的影响。这些实验结果为基于普通光学技术的纳米级工件物理安全的实用可靠方法铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optical authentication of nano-scale artifacts using their interference images under white light illumination

In the age of the Internet of Things, physical security framework of edge devices connected to the Internet is essential. Accordingly, higher security and higher authenticity are strongly required to prevent unauthorized invasion via irregular devices. On the other hand, artifacts comprising nano-scale structures that are smaller than the fabrication resolutions of general technologies are technically difficult to duplicate. Thus, the addition of such artifacts to each edge device or its components can be considered to ensure security and authenticity because the nano-scale artifact metrics are self-defined based on their higher clone resistance. However, reading out and evaluating physical identities of such artifacts requires the use of advanced setups and techniques. Therefore, they are not preferred in widespread practical applications. In this study, we propose and demonstrate an optical approach as another readout method for nano-scale physical identity based on a simpler setup and technology. Furthermore, the performance of experimental authentication using the identity of nano-scale artifacts was quantitatively verified. Our experimental setup operates by following a white light interferometry sensing. Generally, white light interferometry aids in obtaining numerous interference images by changing the distance between the target and the detection setup precisely to reconstruct a height distribution image with nano-scale resolution. However, in our application, reconstruction of the height distribution image is not necessarily required, while a single interference image is expected to be defined as identity of the target artifact. Subsequently, certain interference images were used to calculate the false match and non-match rates to qualitatively evaluate the authentication performance of the proposed method. Furthermore, the dependence of the performance on the spatial resolution and corresponding data size of the interference images was experimentally investigated. The results of these experiments pave the way for a practical and reliable method for the physical security of nano-scale artifacts based on general optical technology.

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来源期刊
Optical Review
Optical Review 物理-光学
CiteScore
2.30
自引率
0.00%
发文量
62
审稿时长
2 months
期刊介绍: Optical Review is an international journal published by the Optical Society of Japan. The scope of the journal is: General and physical optics; Quantum optics and spectroscopy; Information optics; Photonics and optoelectronics; Biomedical photonics and biological optics; Lasers; Nonlinear optics; Optical systems and technologies; Optical materials and manufacturing technologies; Vision; Infrared and short wavelength optics; Cross-disciplinary areas such as environmental, energy, food, agriculture and space technologies; Other optical methods and applications.
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