Elevated temperature structured light scanning for in situ monitoring of forging dies

Metrology grade structured light scanning has been established as an effective non-contact measurement method for dimensional analysis of complex components at standard temperatures. Initial efforts have demonstrated the use of custom structured light systems for measurements of forgings and at elevated temperature environments. However, little work has been done to evaluate the performance of metrology grade structured light systems at elevated temperatures. This paper provides a performance baseline for a commercially available ZEISS ATOS Q structured light system using a calibrated gage block at elevated temperatures. Results show that the measured length of the gage block matches that of simulated lengths using a temperature-dependent coefficient of thermal expansion taken from handbook data. These results motivate the use of structured light scanning for measurements in forging and other elevated temperature manufacturing applications.