小型AMS中像素化硅探测器读出系统

IF 1.4 3区物理与天体物理 Q3 INSTRUMENTS & INSTRUMENTATION

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms Pub Date : 2025-08-29 DOI:10.1016/j.nimb.2025.165841

Mirei Takeyama , Toru Moriya , Hisako Saitoh , Hiroko Miyahara , Fusa Miyake , Hiromasa Ozaki , Tetsuya Shiroishi , Kouji Morimoto , Daiya Kaji , Kentaro Nakamura , Shigeru Itoh , Kazumasa Kosugi , Fuyuki Tokanai

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引用次数: 0

摘要

设计了一种像素化硅探测器（PSD）作为紧凑加速器质谱（AMS）系统焦平面位置敏感探测器。当AMS系统安装在设施中或安装后需要重新排列光束线时，PSD可用于调整其最佳参数。我们为PSD开发了一种新的前置放大器和数据采集系统。该系统比高能实验中通常使用的电路系统更紧凑，重量更轻，使其便携，易于安装在其他设施中。此外，通过在线监测光束轮廓，可以实时进行光束诊断。用α粒子和14C光束研究了该体系的特性。

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Readout system of pixelated silicon detector for compact AMS

A pixelated silicon detector (PSD) has been developed as a position-sensitive detector for the focal plane in a compact accelerator mass spectrometry (AMS) system. The PSD is useful for tuning the optimal parameters of the AMS system when it is installed in a facility and when the beamline needs to be re-arranged after installation. We have developed a new preamplifier and a data acquisition system for the PSD. The system is more compact and lightweight than circuit systems typically used in high-energy experiments, making it portable and easy to install in other facilities. Moreover, beam diagnostics can be performed in real time with online monitoring of the beam profile. The characteristics of the system were investigated using

α

particles and ¹⁴C beams.

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来源期刊

Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms 物理-核科学技术

CiteScore

2.80

自引率

7.70%

发文量

231

审稿时长

1.9 months

期刊介绍： Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.