Jincheng Wang;Yuhao Shu;Lintao Lan;Yifei Li;Bin Ning;Yuxin Zhou;Hongtu Zhang;Yajun Ha
{"title":"基于5T0C edram的内容可寻址存储器,用于高密度搜索和内存逻辑","authors":"Jincheng Wang;Yuhao Shu;Lintao Lan;Yifei Li;Bin Ning;Yuxin Zhou;Hongtu Zhang;Yajun Ha","doi":"10.1109/TVLSI.2025.3585747","DOIUrl":null,"url":null,"abstract":"With the development of big data, there is an increasing demand for high-density searching, where content-addressable memory (CAM) presents an attractive solution for its ability to perform parallel searches. However, this goal is constrained by the difficulty of further reducing the area of SRAM cells, which is commonly used in traditional CAM implementations. To address this issue, we propose a novel CAM with a compact five-transistor-zero-capacitor (5T0C)-embedded dynamic random access memory (eDRAM) for high-density searching and logic-in-memory applications. First, we propose the 5T0C eDRAM gain cell featuring a 3T0C write port and a decoupled read port of 2T to achieve data storage and searching operations. Second, we present a reconfigurable sense amplifier (RSA) design with two different reference voltages to optimize the area overhead of peripheral circuits and support logic operations. Moreover, the 5T0C eDRAM-based CAM can be employed to achieve high-density searching and logic operations. We have validated the eDRAM-based CAM array in the 40-nm CMOS process. The postlayout simulation results show that our design achieves over 15% higher memory density compared to the state-of-the-art 6T SRAM. Additionally, it supports a maximum frequency of 637 and 658 MHz for binary CAM (BCAM) searching and logic operations, while consuming 0.91 and 27.47 fJ/bit at 1.1 V, respectively.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 9","pages":"2497-2507"},"PeriodicalIF":3.1000,"publicationDate":"2025-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 5T0C eDRAM-Based Content Addressable Memory for High-Density Searching and Logic-in-Memory\",\"authors\":\"Jincheng Wang;Yuhao Shu;Lintao Lan;Yifei Li;Bin Ning;Yuxin Zhou;Hongtu Zhang;Yajun Ha\",\"doi\":\"10.1109/TVLSI.2025.3585747\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the development of big data, there is an increasing demand for high-density searching, where content-addressable memory (CAM) presents an attractive solution for its ability to perform parallel searches. However, this goal is constrained by the difficulty of further reducing the area of SRAM cells, which is commonly used in traditional CAM implementations. To address this issue, we propose a novel CAM with a compact five-transistor-zero-capacitor (5T0C)-embedded dynamic random access memory (eDRAM) for high-density searching and logic-in-memory applications. First, we propose the 5T0C eDRAM gain cell featuring a 3T0C write port and a decoupled read port of 2T to achieve data storage and searching operations. Second, we present a reconfigurable sense amplifier (RSA) design with two different reference voltages to optimize the area overhead of peripheral circuits and support logic operations. Moreover, the 5T0C eDRAM-based CAM can be employed to achieve high-density searching and logic operations. We have validated the eDRAM-based CAM array in the 40-nm CMOS process. The postlayout simulation results show that our design achieves over 15% higher memory density compared to the state-of-the-art 6T SRAM. Additionally, it supports a maximum frequency of 637 and 658 MHz for binary CAM (BCAM) searching and logic operations, while consuming 0.91 and 27.47 fJ/bit at 1.1 V, respectively.\",\"PeriodicalId\":13425,\"journal\":{\"name\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"volume\":\"33 9\",\"pages\":\"2497-2507\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2025-07-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11086510/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11086510/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A 5T0C eDRAM-Based Content Addressable Memory for High-Density Searching and Logic-in-Memory
With the development of big data, there is an increasing demand for high-density searching, where content-addressable memory (CAM) presents an attractive solution for its ability to perform parallel searches. However, this goal is constrained by the difficulty of further reducing the area of SRAM cells, which is commonly used in traditional CAM implementations. To address this issue, we propose a novel CAM with a compact five-transistor-zero-capacitor (5T0C)-embedded dynamic random access memory (eDRAM) for high-density searching and logic-in-memory applications. First, we propose the 5T0C eDRAM gain cell featuring a 3T0C write port and a decoupled read port of 2T to achieve data storage and searching operations. Second, we present a reconfigurable sense amplifier (RSA) design with two different reference voltages to optimize the area overhead of peripheral circuits and support logic operations. Moreover, the 5T0C eDRAM-based CAM can be employed to achieve high-density searching and logic operations. We have validated the eDRAM-based CAM array in the 40-nm CMOS process. The postlayout simulation results show that our design achieves over 15% higher memory density compared to the state-of-the-art 6T SRAM. Additionally, it supports a maximum frequency of 637 and 658 MHz for binary CAM (BCAM) searching and logic operations, while consuming 0.91 and 27.47 fJ/bit at 1.1 V, respectively.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.