硅衬底氟化锂薄膜中荧光低能质子径迹的检测

IF 3.6 3区 物理与天体物理 Q2 OPTICS
Massimo Piccinini , Enrico Nichelatti , Valentina Nigro , Francesca Menchini , Marco Montecchi , Rosa Maria Montereali , Alessandro Ampollini , Concetta Ronsivalle , Maria Aurora Vincenti
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引用次数: 0

摘要

最近,荧光核径迹探测器(FNTDs)利用F2和F3+色中心(CCs)的可见辐射光致发光(RPL)在氟化锂(liff)晶体中得到了证实。在本文中,基于在Si(100)衬底上通过热蒸发生长的LiF薄膜的固态辐射探测器,在ENEA Frascati运行的TOP-IMPLART直线加速器的垂直低能萃取线产生的~ 1 MeV质子束中作为FNTDs进行了测试。用近似平行于光束传播方向的薄膜表面进行辐照(即,劈开的薄膜边缘直接暴露在入射光束中)。在107 ~ 108个质子/cm2的影响下,利用高倍率的荧光显微镜首次在liff薄膜中观察到单个质子轨迹的发光图像。测量了连续波蓝色激光激发下的RPL光谱,研究了F2和F3+发射带的行为,其强度随激发功率的不同而不同。增加两个数量级的质子束的影响,叠加更多的轨迹允许完全探测到光束的发光布拉格曲线,即使在这个低质子能量。利用FLUKA模拟Si上LiF层的能量沉积,通过最优拟合该发光Bragg曲线来估计质子束的能谱。该层被精确建模,其密度由椭偏测量的折射率得出。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detection of fluorescent low-energy proton tracks in lithium fluoride thin films on silicon substrates
Recently, Fluorescent Nuclear Track Detectors (FNTDs) have been demonstrated in lithium fluoride (LiF) crystals exploiting the visible radiophotoluminescence (RPL) of F2 and F3+ color centers (CCs). In this paper, solid-state radiation detectors based on LiF thin films, grown by thermal evaporation on Si(100) substrates, were tested as FNTDs with ∼1 MeV proton beams produced by the vertical low-energy extraction line of the TOP-IMPLART linear accelerator in operation at ENEA Frascati. They were irradiated with the film surface approximately parallel to the beam propagation direction (i.e. the cleaved film edge was directly exposed to the incident beam). For the first time, at fluences between 107 and 108 protons/cm2, luminescent images of single proton tracks were visualized in LiF films using a fluorescence microscope at high magnification. RPL spectra under continuous-wave blue laser excitation were also measured to study the behavior of the F2 and F3+ emission bands, whose intensities show a different dependence on the excitation power. Increasing the proton beam fluence by two orders of magnitude, the superposition of a higher number of tracks allowed to fully detect the luminescent Bragg curve of the beam, even at this low proton energy. The energy spectrum of the proton beam was estimated by best fitting this luminescent Bragg curve, using FLUKA simulations of energy deposition in a LiF layer on Si. The layer was accurately modeled, and its density was derived from ellipsometric measurements of the refractive index.
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来源期刊
Journal of Luminescence
Journal of Luminescence 物理-光学
CiteScore
6.70
自引率
13.90%
发文量
850
审稿时长
3.8 months
期刊介绍: The purpose of the Journal of Luminescence is to provide a means of communication between scientists in different disciplines who share a common interest in the electronic excited states of molecular, ionic and covalent systems, whether crystalline, amorphous, or liquid. We invite original papers and reviews on such subjects as: exciton and polariton dynamics, dynamics of localized excited states, energy and charge transport in ordered and disordered systems, radiative and non-radiative recombination, relaxation processes, vibronic interactions in electronic excited states, photochemistry in condensed systems, excited state resonance, double resonance, spin dynamics, selective excitation spectroscopy, hole burning, coherent processes in excited states, (e.g. coherent optical transients, photon echoes, transient gratings), multiphoton processes, optical bistability, photochromism, and new techniques for the study of excited states. This list is not intended to be exhaustive. Papers in the traditional areas of optical spectroscopy (absorption, MCD, luminescence, Raman scattering) are welcome. Papers on applications (phosphors, scintillators, electro- and cathodo-luminescence, radiography, bioimaging, solar energy, energy conversion, etc.) are also welcome if they present results of scientific, rather than only technological interest. However, papers containing purely theoretical results, not related to phenomena in the excited states, as well as papers using luminescence spectroscopy to perform routine analytical chemistry or biochemistry procedures, are outside the scope of the journal. Some exceptions will be possible at the discretion of the editors.
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