用于无损纳米电子电路成像和检测的天然范德瓦尔斯管化透镜(Adv. Mater. 32/2025)

IF 26.8 1区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY
Qingdong Ou, Shuwen Xue, Weiliang Ma, Jiong Yang, Guangyuan Si, Lu Liu, Gang Zhong, Jingying Liu, Zongyuan Xie, Ying Xiao, Tian Sun, Ding Yuan, Kourosh Kalantar-Zadeh, Peining Li, Zhigao Dai, Huanyang Chen, Qiaoliang Bao
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引用次数: 0

摘要

在文章编号2504526中,欧青东,戴志高,陈焕阳,包乔亮等人证明了范德华运河透镜可以实现低于15nm分辨率的埋藏电子电路的多向超分辨率成像。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Natural van der Waals Canalization Lens for Non-Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)

Natural van der Waals Canalization Lens for Non-Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)

Natural van der Waals Canalization Lens for Non-Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)

Natural van der Waals Canalization Lens for Non-Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)

Natural van der Waals Canalization Lens for Non-Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)

Super-Resolution Imaging

In article number 2504526, Qingdong Ou, Zhigao Dai, Huanyang Chen, Qiaoliang Bao, and colleagues demonstrate that van der Waals canalization lenses enable multi-directional super-resolution imaging of buried electronic circuits with sub-15 nm resolution.

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来源期刊
Advanced Materials
Advanced Materials 工程技术-材料科学:综合
CiteScore
43.00
自引率
4.10%
发文量
2182
审稿时长
2 months
期刊介绍: Advanced Materials, one of the world's most prestigious journals and the foundation of the Advanced portfolio, is the home of choice for best-in-class materials science for more than 30 years. Following this fast-growing and interdisciplinary field, we are considering and publishing the most important discoveries on any and all materials from materials scientists, chemists, physicists, engineers as well as health and life scientists and bringing you the latest results and trends in modern materials-related research every week.
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