Natural van der Waals Canalization Lens for Non-Destructive Nanoelectronic Circuit Imaging and Inspection (Adv. Mater. 32/2025)
Super-Resolution Imaging
In article number 2504526, Qingdong Ou, Zhigao Dai, Huanyang Chen, Qiaoliang Bao, and colleagues demonstrate that van der Waals canalization lenses enable multi-directional super-resolution imaging of buried electronic circuits with sub-15 nm resolution.
期刊介绍:
Advanced Materials, one of the world's most prestigious journals and the foundation of the Advanced portfolio, is the home of choice for best-in-class materials science for more than 30 years. Following this fast-growing and interdisciplinary field, we are considering and publishing the most important discoveries on any and all materials from materials scientists, chemists, physicists, engineers as well as health and life scientists and bringing you the latest results and trends in modern materials-related research every week.