基于共振稳定性的cma驱动三角形贴片天线极化纯度增强

IF 1.2 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Susamay Samanta, P Soni Reddy, Kaushik Mandal
{"title":"基于共振稳定性的cma驱动三角形贴片天线极化纯度增强","authors":"Susamay Samanta,&nbsp;P Soni Reddy,&nbsp;Kaushik Mandal","doi":"10.1002/mop.70351","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>This letter presents an innovative strategy to improve polarization purity in space-constrained microstrip patch antennas using a low-profile metal-pin-based superstructure. The triangular patch, an inherently compact antenna shape, suffers from high cross-polarized field components, an issue that has been largely overlooked. Using characteristic mode analysis (CMA), the near-field E-field distribution of the <span></span><math>\n <semantics>\n <mrow>\n \n <mrow>\n <mi>T</mi>\n \n <msub>\n <mi>M</mi>\n \n <mn>10</mn>\n </msub>\n </mrow>\n </mrow>\n <annotation> $T{M}_{10}$</annotation>\n </semantics></math> mode reveals that the <span></span><math>\n <semantics>\n <mrow>\n \n <mrow>\n <msub>\n <mi>E</mi>\n \n <mi>x</mi>\n </msub>\n </mrow>\n </mrow>\n <annotation> ${E}_{x}$</annotation>\n </semantics></math> and <span></span><math>\n <semantics>\n <mrow>\n \n <mrow>\n <msub>\n <mi>E</mi>\n \n <mi>y</mi>\n </msub>\n </mrow>\n </mrow>\n <annotation> ${E}_{y}$</annotation>\n </semantics></math> components overlap near the apex, leading to increased cross-polarization (XP). While latest minimally invasive method using partially shorting pins causes a 2.2% upward frequency shift, this noninvasive approach results in a 0.3% downward frequency shift, maintaining compactness and scalability. Experimental results demonstrate normalized peak XP levels of −38 dB in the E-plane, −28 dB in the H-plane, and −18 dB in the diagonal plane, with a peak gain of 7.2 dBi, confirming the effectiveness of the design.</p>\n </div>","PeriodicalId":18562,"journal":{"name":"Microwave and Optical Technology Letters","volume":"67 8","pages":""},"PeriodicalIF":1.2000,"publicationDate":"2025-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"CMA-Driven Polarization Purity Enhancement in Triangular Patch Antennas With Resonance Stability\",\"authors\":\"Susamay Samanta,&nbsp;P Soni Reddy,&nbsp;Kaushik Mandal\",\"doi\":\"10.1002/mop.70351\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div>\\n \\n <p>This letter presents an innovative strategy to improve polarization purity in space-constrained microstrip patch antennas using a low-profile metal-pin-based superstructure. The triangular patch, an inherently compact antenna shape, suffers from high cross-polarized field components, an issue that has been largely overlooked. Using characteristic mode analysis (CMA), the near-field E-field distribution of the <span></span><math>\\n <semantics>\\n <mrow>\\n \\n <mrow>\\n <mi>T</mi>\\n \\n <msub>\\n <mi>M</mi>\\n \\n <mn>10</mn>\\n </msub>\\n </mrow>\\n </mrow>\\n <annotation> $T{M}_{10}$</annotation>\\n </semantics></math> mode reveals that the <span></span><math>\\n <semantics>\\n <mrow>\\n \\n <mrow>\\n <msub>\\n <mi>E</mi>\\n \\n <mi>x</mi>\\n </msub>\\n </mrow>\\n </mrow>\\n <annotation> ${E}_{x}$</annotation>\\n </semantics></math> and <span></span><math>\\n <semantics>\\n <mrow>\\n \\n <mrow>\\n <msub>\\n <mi>E</mi>\\n \\n <mi>y</mi>\\n </msub>\\n </mrow>\\n </mrow>\\n <annotation> ${E}_{y}$</annotation>\\n </semantics></math> components overlap near the apex, leading to increased cross-polarization (XP). While latest minimally invasive method using partially shorting pins causes a 2.2% upward frequency shift, this noninvasive approach results in a 0.3% downward frequency shift, maintaining compactness and scalability. Experimental results demonstrate normalized peak XP levels of −38 dB in the E-plane, −28 dB in the H-plane, and −18 dB in the diagonal plane, with a peak gain of 7.2 dBi, confirming the effectiveness of the design.</p>\\n </div>\",\"PeriodicalId\":18562,\"journal\":{\"name\":\"Microwave and Optical Technology Letters\",\"volume\":\"67 8\",\"pages\":\"\"},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2025-08-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microwave and Optical Technology Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/mop.70351\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microwave and Optical Technology Letters","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/mop.70351","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

这封信提出了一个创新的策略,以提高极化纯度在空间受限的微带贴片天线使用一个低调的金属引脚为基础的上层结构。三角形贴片,固有的紧凑的天线形状,受到高交叉极化场分量的影响,这是一个很大程度上被忽视的问题。利用特征模态分析(CMA),tm10 $T{M}_{10}$模态的近场E-场分布揭示了tm10 $T{M}_{10}$模态的E-场分布x ${E}_{x}$和ey ${E}_{y}$分量在顶点附近重叠,导致交叉极化增加(XP)。虽然使用部分短针的最新微创方法会导致2.2%的向上频移,但这种非侵入性方法会导致0.3%的向下频移,同时保持了紧凑性和可扩展性。实验结果表明,e面归一化峰值XP值为−38 dB, h面归一化峰值XP值为−28 dB,对角线面归一化峰值XP值为−18 dB,峰值增益为7.2 dBi,验证了设计的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CMA-Driven Polarization Purity Enhancement in Triangular Patch Antennas With Resonance Stability

This letter presents an innovative strategy to improve polarization purity in space-constrained microstrip patch antennas using a low-profile metal-pin-based superstructure. The triangular patch, an inherently compact antenna shape, suffers from high cross-polarized field components, an issue that has been largely overlooked. Using characteristic mode analysis (CMA), the near-field E-field distribution of the T M 10 $T{M}_{10}$ mode reveals that the E x ${E}_{x}$ and E y ${E}_{y}$ components overlap near the apex, leading to increased cross-polarization (XP). While latest minimally invasive method using partially shorting pins causes a 2.2% upward frequency shift, this noninvasive approach results in a 0.3% downward frequency shift, maintaining compactness and scalability. Experimental results demonstrate normalized peak XP levels of −38 dB in the E-plane, −28 dB in the H-plane, and −18 dB in the diagonal plane, with a peak gain of 7.2 dBi, confirming the effectiveness of the design.

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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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