Thomas Athey, Shashata Sawmya, Yaron Meirovitch, Richard Schalek, Pavel Potocek, Ishaan Chandok, Maurice Peemen, Jeff Lichtman, Aravinthan Samuel, Nir Shavit
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Smart microscopy is a new imaging approach that involves rapid imaging, prediction of important subregions, then selective re-imaging. This approach has been validated in reducing imaging beam time in electron microscopy connectomics, but the speedup depends on various imaging workflow parameters. Here we present the first runtime analysis of traditional vs. smart microscopy and show how these parameters can magnify, or diminish potential time savings. We provide a GUI application that calculates the theoretical time savings of smart microscopy from user input parameters describing their imaging workflow. Finally, we measure end-to-end runtime of SmartEM acquisition on an electron microscope to demonstrate two strategies for faster acquisition: mixed-precision neural networks and parallelization of microscope and support computer operations.
Applied MicroscopyImmunology and Microbiology-Applied Microbiology and Biotechnology
CiteScore
3.40
自引率
0.00%
发文量
10
审稿时长
10 weeks
期刊介绍:
Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.