控制强度电流电沉积提高BiVO4薄膜的光电化学性能。

IF 2.7 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Beilstein Journal of Nanotechnology Pub Date : 2025-08-07 eCollection Date: 2025-01-01 DOI:10.3762/bjnano.16.94
Huu Phuc Dang, Khanh Quang Nguyen, Nguyen Thi Mai Tho, Tran Le
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引用次数: 0

摘要

本研究采用可控强度电流电沉积法制备BiVO4光阳极,以提高其光电化学性能。系统分析了不同沉积电流密度和VO(acac)2浓度对薄膜结晶度、表面形貌和电子性能的影响。随后,采用电化学沉积的方法使V2O5均匀分布在Bi-O-I薄片中,以促进转化反应的均匀性。XRD谱图证实白钨矿BiVO4为单斜晶型结构,主要峰为(121)和(004)。FESEM成像结果表明,不同的沉积条件影响了BiVO4和bii薄膜的表面形貌。光电流密度测量表明,BiVO4(326)在1.23 V vs RHE下达到1.2 mA·cm-2,与其他样品相比有显著增强。表面空穴注入效率为47%,而入射光子电流效率在420 nm处达到18.1%的峰值。BiVO4(326)的应用偏置光子电流效率也优于低电流密度制备的样品,突出了优化电沉积条件对前者的好处。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Enhancing the photoelectrochemical performance of BiOI-derived BiVO<sub>4</sub> films by controlled-intensity current electrodeposition.

Enhancing the photoelectrochemical performance of BiOI-derived BiVO<sub>4</sub> films by controlled-intensity current electrodeposition.

Enhancing the photoelectrochemical performance of BiOI-derived BiVO<sub>4</sub> films by controlled-intensity current electrodeposition.

Enhancing the photoelectrochemical performance of BiOI-derived BiVO4 films by controlled-intensity current electrodeposition.

This study investigates the fabrication of BiVO4 photoanodes using a controlled-intensity current electrodeposition method to improve their photoelectrochemical (PEC) performance. The impact of varying the deposition current density and VO(acac)2 concentration was systematically analyzed to optimize the crystallinity, surface morphology, and electronic properties of the films. Subsequently, an electrochemical deposition method was developed to facilitate the uniform distribution of V2O5 among Bi-O-I flakes to homogeneously enhance the conversion reaction. The XRD pattern confirms the monoclinic scheelite BiVO4 structure with dominant (121) and (004) peaks. FESEM imaging revealed that the different deposition conditions influenced the surface morphologies of the BiOI and BiVO4 films. Photocurrent density measurements showed that BiVO4(326) achieved 1.2 mA·cm-2 at 1.23 V vs RHE, representing a significant enhancement compared to the other samples. The surface hole injection efficiency was measured to be 47%, whereas the incident photon-to-current efficiency reached a peak of 18.1% at 420 nm. The applied bias photon-to-current efficiency of BiVO4(326) was also superior to that of the samples fabricated with lower current density, highlighting the benefits of the optimized electrodeposition conditions for the former.

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来源期刊
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.70
自引率
3.20%
发文量
109
审稿时长
2 months
期刊介绍: The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology. The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.
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