均匀体样品的两种蒙特卡罗方法的比较。

IF 1.9 4区 工程技术 Q3 MICROSCOPY
Dawei Gao, Yu Yuan, Nicolas Brodusch, Raynald Gauvin
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引用次数: 0

摘要

本文介绍了MC x射线和PENELOPE两个软件包的比较分析,重点讨论了它们在模拟二元化合物k比方面的准确性和效率,并将它们的光谱与纯元素和化合物的实验数据进行了比较。基于Pouchou数据库,MC X-ray在k-ratio计算方面略优于PENELOPE,均方根误差(RMSE)为2.71%,标准差为0.027,而PENELOPE为2.87%,标准差为0.053。在较低的束流能量(3 keV和5 keV)下,模拟光谱与实验数据比较,两者之间存在差异;然而,在更高的能量(20和30 keV)下,两个软件包在原子序数范围内表现出一致和可靠的性能。虽然这两种工具都有效地分析均质散装样品,但MC x射线在处理速度和用户友好性方面具有显着优势。本研究强调了每个封装的优势和局限性,为从事x射线模拟和微量分析的研究人员提供了有价值的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Comparison of two Monte Carlo approaches for homogeneous bulk samples

Comparison of two Monte Carlo approaches for homogeneous bulk samples

This manuscript presents a comparative analysis of two software packages, MC X-ray and PENELOPE, focusing on their accuracy and efficiency in simulating k-ratios for binary compounds and comparing their spectra with experimental data for pure elements and compounds. Based on the Pouchou database, MC X-ray slightly outperforms PENELOPE in k-ratio calculations, achieving a root mean square error (RMSE) of 2.71% with a standard deviation of 0.027, compared to 2.87% with a standard deviation of 0.053. Discrepancies between the two programs emerge at lower beam energies (3 and 5 keV) when comparing simulated spectra with experimental data; however, at higher energies (20 and 30 keV), both software packages exhibit consistent and reliable performance across a range of atomic numbers. While both tools are effective for analysing homogeneous bulk samples, MC X-ray offers significant advantages in processing speed and user-friendliness. This study underscores the strengths and limitations of each package, providing valuable insights for researchers engaged in X-ray simulation and microanalysis.

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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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