EXPRESS:基于逐像元反射率标准差的近红外高光谱图像背景像素去除。

IF 2.2 3区 化学 Q2 INSTRUMENTS & INSTRUMENTATION
Takuma Genkawa, Akifumi Ikehata
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引用次数: 0

摘要

本研究提出了一种基于逐像标准差反射率法(px-wise SD method)的近红外高光谱图像背景像素去除方法。该方法计算每个像素(即每个光谱)的反射率的标准差(SD),并从得到的逐像素SD直方图中确定区分背景像素和目标像素的阈值。该方法的有效性是通过在低反射率薄片或白纸上放置带有孔的叶子状糕点的高光谱图像来评估的。在白纸上,反射率的x向SD呈三峰直方图,其中有两个突出的峰,中间有一个小峰。具有较低SD的突出峰对应于白纸像素,而具有较高SD的另一个峰与糕点的表面和边缘像素相关。小峰表示孔的像素。背景和目标像素可以通过在这个小峰值和突出的峰值之间设置阈值来有效地分离。此外,无论背景材料的类型如何,仅使用目标像素计算的平均光谱保持一致。相反,使用所有像素计算的平均光谱由于背景材料的光谱包含而失真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Background Pixel Removal for Near-Infrared Hyperspectral Images Based on the Pixel-Wise Standard Deviation of Reflectance.

This study proposes a method to remove background pixels from near-infrared hyperspectral images based on the pixel-wise standard deviation of reflectance method (px-wise SD method). This method calculates the standard deviation (SD) of reflectance in each pixel, namely each spectrum, and determines a threshold to distinguish between background and object pixels from the resulting histogram of the px-wise SD. The method effectiveness is evaluated using hyperspectral images of a leaf-like pastry with a hole placed on either a low-reflectance sheet or white paper. On white paper, the px-wise SD of reflectance exhibits a trimodal histogram with two prominent peaks and one small peak between them. The prominent peak with a lower SD corresponds to the white paper pixels, whereas the other peak with a higher SD is associated with the surface and edge pixels of the pastry. The small peak represents the pixels of the hole. The background and object pixels can be effectively separated by setting a threshold between this small peak and the prominent peak for the pastry pixels. Moreover, the mean spectrum calculated using only object pixels remains consistent, regardless of the type of background material. Conversely, the mean spectrum calculated using all pixels is distorted due to the spectral inclusion of the background material.

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来源期刊
Applied Spectroscopy
Applied Spectroscopy 工程技术-光谱学
CiteScore
6.60
自引率
5.70%
发文量
139
审稿时长
3.5 months
期刊介绍: Applied Spectroscopy is one of the world''s leading spectroscopy journals, publishing high-quality peer-reviewed articles, both fundamental and applied, covering all aspects of spectroscopy. Established in 1951, the journal is owned by the Society for Applied Spectroscopy and is published monthly. The journal is dedicated to fulfilling the mission of the Society to “…advance and disseminate knowledge and information concerning the art and science of spectroscopy and other allied sciences.”
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