{"title":"含滞后夹层模型的三阶段辨识方法","authors":"Ya Gu;Haiyan Hou;Yonghong Tan","doi":"10.1109/TCSII.2025.3580551","DOIUrl":null,"url":null,"abstract":"This brief investigates the identification of sandwich systems exhibiting hysteresis behavior. To address the problem that the filtering effect of the previous-stage subsystem on the input signal results in the filtered excitation input causing insufficient excitation of the subsequent-stage subsystems, thus reducing the identification accuracy, a new robust three-stage identification method is proposed to ensure the sufficient excitation of the entire system and enhance the identification accuracy. The key to this method lies in the staged estimation of subsystem parameters. In each stage, parameter estimation is carried out using the key-item separation principle combined with an iterative process. Then, based on the previously estimated submodel parameters, an inverse model is developed to filter the input excitation signal. Therefore, the insufficient excitation of the subsequent-stage subsystem caused by the filtering effect of the previous-stage subsystem on the input signal is counteracted, enhancing parameter estimation accuracy. Finally, this method is applied to the parameter identification of an electromagnetic micromirror.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"72 8","pages":"1058-1062"},"PeriodicalIF":4.9000,"publicationDate":"2025-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Three-Stage Identification Method of the Sandwich Model With Hysteresis\",\"authors\":\"Ya Gu;Haiyan Hou;Yonghong Tan\",\"doi\":\"10.1109/TCSII.2025.3580551\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This brief investigates the identification of sandwich systems exhibiting hysteresis behavior. To address the problem that the filtering effect of the previous-stage subsystem on the input signal results in the filtered excitation input causing insufficient excitation of the subsequent-stage subsystems, thus reducing the identification accuracy, a new robust three-stage identification method is proposed to ensure the sufficient excitation of the entire system and enhance the identification accuracy. The key to this method lies in the staged estimation of subsystem parameters. In each stage, parameter estimation is carried out using the key-item separation principle combined with an iterative process. Then, based on the previously estimated submodel parameters, an inverse model is developed to filter the input excitation signal. Therefore, the insufficient excitation of the subsequent-stage subsystem caused by the filtering effect of the previous-stage subsystem on the input signal is counteracted, enhancing parameter estimation accuracy. Finally, this method is applied to the parameter identification of an electromagnetic micromirror.\",\"PeriodicalId\":13101,\"journal\":{\"name\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"volume\":\"72 8\",\"pages\":\"1058-1062\"},\"PeriodicalIF\":4.9000,\"publicationDate\":\"2025-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11039038/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems II: Express Briefs","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11039038/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
The Three-Stage Identification Method of the Sandwich Model With Hysteresis
This brief investigates the identification of sandwich systems exhibiting hysteresis behavior. To address the problem that the filtering effect of the previous-stage subsystem on the input signal results in the filtered excitation input causing insufficient excitation of the subsequent-stage subsystems, thus reducing the identification accuracy, a new robust three-stage identification method is proposed to ensure the sufficient excitation of the entire system and enhance the identification accuracy. The key to this method lies in the staged estimation of subsystem parameters. In each stage, parameter estimation is carried out using the key-item separation principle combined with an iterative process. Then, based on the previously estimated submodel parameters, an inverse model is developed to filter the input excitation signal. Therefore, the insufficient excitation of the subsequent-stage subsystem caused by the filtering effect of the previous-stage subsystem on the input signal is counteracted, enhancing parameter estimation accuracy. Finally, this method is applied to the parameter identification of an electromagnetic micromirror.
期刊介绍:
TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes:
Circuits: Analog, Digital and Mixed Signal Circuits and Systems
Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic
Circuits and Systems, Power Electronics and Systems
Software for Analog-and-Logic Circuits and Systems
Control aspects of Circuits and Systems.