{"title":"基于增强U-Net结构的t1加权MRI脑肿瘤定位与分割","authors":"Somayeh Davar;Thomas Fevens","doi":"10.1109/TCSII.2025.3556846","DOIUrl":null,"url":null,"abstract":"Detection and segmentation of Magnetic Resonance Imaging (MRI) scans is a critical task in medical imaging, where achieving high segmentation precision and reliability remains challenging due to variations in tumor shape, size, intensity, and boundary definition across different MRI modalities. Recently, deep learning techniques have significantly improved the efficiency oflocalization and segmentation of various medical fields, including brain tumoursanalysis. This brief presents a novel two-stage approach for brain tumour segmentation in T1-weighted contrast-enhanced MRI (CE-MRI) scans, leveraging both YOLO (you only look once) and Modified U-Net. In the first stage, YOLO is employed to quickly and accurately localize regions of interest (ROIs) where brain tumours are present. To accelerate this step, YOLOv3 are incorporated, improving the computation speed and efficiency of the model. In the second stage, a modified U-NET model, enhanced with spatial and channel attention modules, is utilized to perform precise segmentation of the tumours within the identified ROIs. The performance of the proposed framework is evaluated using metrics including precision, recall, Jaccard index, and Dice similarity coefficient (DSC). Our approach demonstrates promising results compared to previous methods using the same database.","PeriodicalId":13101,"journal":{"name":"IEEE Transactions on Circuits and Systems II: Express Briefs","volume":"72 8","pages":"993-997"},"PeriodicalIF":4.9000,"publicationDate":"2025-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhanced U-Net Architecture for Brain Tumor Localization and Segmentation in T1-Weighted MRI\",\"authors\":\"Somayeh Davar;Thomas Fevens\",\"doi\":\"10.1109/TCSII.2025.3556846\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Detection and segmentation of Magnetic Resonance Imaging (MRI) scans is a critical task in medical imaging, where achieving high segmentation precision and reliability remains challenging due to variations in tumor shape, size, intensity, and boundary definition across different MRI modalities. Recently, deep learning techniques have significantly improved the efficiency oflocalization and segmentation of various medical fields, including brain tumoursanalysis. This brief presents a novel two-stage approach for brain tumour segmentation in T1-weighted contrast-enhanced MRI (CE-MRI) scans, leveraging both YOLO (you only look once) and Modified U-Net. In the first stage, YOLO is employed to quickly and accurately localize regions of interest (ROIs) where brain tumours are present. To accelerate this step, YOLOv3 are incorporated, improving the computation speed and efficiency of the model. In the second stage, a modified U-NET model, enhanced with spatial and channel attention modules, is utilized to perform precise segmentation of the tumours within the identified ROIs. The performance of the proposed framework is evaluated using metrics including precision, recall, Jaccard index, and Dice similarity coefficient (DSC). Our approach demonstrates promising results compared to previous methods using the same database.\",\"PeriodicalId\":13101,\"journal\":{\"name\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"volume\":\"72 8\",\"pages\":\"993-997\"},\"PeriodicalIF\":4.9000,\"publicationDate\":\"2025-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Circuits and Systems II: Express Briefs\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10947068/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Circuits and Systems II: Express Briefs","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10947068/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Enhanced U-Net Architecture for Brain Tumor Localization and Segmentation in T1-Weighted MRI
Detection and segmentation of Magnetic Resonance Imaging (MRI) scans is a critical task in medical imaging, where achieving high segmentation precision and reliability remains challenging due to variations in tumor shape, size, intensity, and boundary definition across different MRI modalities. Recently, deep learning techniques have significantly improved the efficiency oflocalization and segmentation of various medical fields, including brain tumoursanalysis. This brief presents a novel two-stage approach for brain tumour segmentation in T1-weighted contrast-enhanced MRI (CE-MRI) scans, leveraging both YOLO (you only look once) and Modified U-Net. In the first stage, YOLO is employed to quickly and accurately localize regions of interest (ROIs) where brain tumours are present. To accelerate this step, YOLOv3 are incorporated, improving the computation speed and efficiency of the model. In the second stage, a modified U-NET model, enhanced with spatial and channel attention modules, is utilized to perform precise segmentation of the tumours within the identified ROIs. The performance of the proposed framework is evaluated using metrics including precision, recall, Jaccard index, and Dice similarity coefficient (DSC). Our approach demonstrates promising results compared to previous methods using the same database.
期刊介绍:
TCAS II publishes brief papers in the field specified by the theory, analysis, design, and practical implementations of circuits, and the application of circuit techniques to systems and to signal processing. Included is the whole spectrum from basic scientific theory to industrial applications. The field of interest covered includes:
Circuits: Analog, Digital and Mixed Signal Circuits and Systems
Nonlinear Circuits and Systems, Integrated Sensors, MEMS and Systems on Chip, Nanoscale Circuits and Systems, Optoelectronic
Circuits and Systems, Power Electronics and Systems
Software for Analog-and-Logic Circuits and Systems
Control aspects of Circuits and Systems.