利用空间频率滤波进行边缘检测

IF 3.7 2区 工程技术 Q2 ENGINEERING, MANUFACTURING
Jingwei Wang , Tatsuki Otsubo , Megumu Kuroiwa , Toshiaki Yasaka , Soichirou Kanemaru , Takanori Yazawa
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引用次数: 0

摘要

本研究提出了一种基于空间频率滤波的缺陷检测系统,用于测量超细晶粒硬质合金直边冲孔刀片和闭曲线冲孔模具两种刀具的刃口切屑。尽管采用了不同的光学配置来适应每个工具的几何形状,但两个系统都基于相同的测量原理,使用高通空间频率滤波,并且它们共享统一的图像处理算法,用于量化边缘芯片并抑制灰尘和其他噪声的影响。在傅里叶变换透镜的后焦平面上放置一个空间滤波器,以阻挡0阶光线,形成清晰的光-暗-光条纹图案。结合所提出的图像处理算法,可以准确提取边缘位置并对微尺度缺陷进行鲁棒性评估。实验表明,所开发的系统可以在两种刀具中检测出大于1 μm的边缘切屑。本研究提出了一种实用且适应性强的非接触式缺陷检测方法,为工业刀片制造的先进质量保证做出了贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Inspection of edge detection using spatial frequency filtering
This study proposes a defect detection system based on spatial frequency filtering to measure edge chipping in two types of tools: straight-edged punching blades and closed-curve punching dies, both made of ultrafine grain cemented carbide. Although different optical configurations were applied to accommodate the geometry of each tool, both systems are based on the same measurement principle using high-pass spatial frequency filtering, and they share a unified image processing algorithm for quantifying edge chipping and suppressing the influence of dust and other noise. A spatial filter is placed at the back focal plane of the Fourier transform lens to block the 0-order ray, forming a clear light-dark-light fringe pattern. Combined with the proposed image processing algorithm, this enables accurate extraction of edge positions and robust evaluation of micro-scale defects. Experiments demonstrated that the developed system could detect edge chipping larger than 1 μm in both types of tools. This research presents a practical and adaptable solution for non-contact defect detection and contributes to advanced quality assurance in industrial blade manufacturing.
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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