应用便携式x射线荧光光谱和厚度监测仪对铁和锌锈层进行现场分析

IF 3.8 2区化学 Q1 SPECTROSCOPY

Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2025-07-25 DOI:10.1016/j.sab.2025.107285

Housei Akazawa, Takashi Sakamoto

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引用次数: 0

摘要

本文提出了一种利用x射线荧光（XRF）光谱对钢锈和锌锈进行现场分析的新方法。该方法由薄膜模式分析组成，其中加入铁锈中的Cl−离子用作不受铁和氧含量影响的标记。利用便携式分析仪在多点同时监测锈层厚度，得到锈层厚度(t)与Cl含量（fCl）的关系图，表征锈层的性质。论证了对严重腐蚀钢和镀锌钢试样进行激光局部除锈的可行性。t- fCl曲线的斜率表示Cl的去除效率。对于非常薄的残余锈，通过在纯水中溶解氯化物的电阻率测量得到Cl含量与表面Cl密度的关系表明，XRF测量的表观Cl含量为0.4%对应于50 mg/m2的盐密度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Application of portable X-ray fluorescence spectroscopy and thickness monitor to characterize iron and zinc rust layer for on-site analysis

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Application of portable X-ray fluorescence spectroscopy and thickness monitor to characterize iron and zinc rust layer for on-site analysis

We propose a new method for on-site analysis of steel rust and Zn rust by exploiting X-ray fluorescence (XRF) spectroscopy. This method consists of a thin-film mode analysis in which Cl⁻ ions incorporated in rust are used as a marker unaffected by the iron and oxygen content. By simultaneously monitoring the thickness of the rust layer with a portable analyzer at multiple points, a diagram of rust thickness (t) versus Cl content (f_Cl) is obtained to characterize the properties of the rust. The feasibility is demonstrated for severely corroded steel and galvanized steel samples after partial derusting by laser irradiation. The slope of the t- f_Cl plot represents Cl removal efficiency. For very thin residual rust, the relation between Cl content and surface Cl density derived by a resistivity measurement through solving chlorides in pure water indicated that an apparent Cl content of 0.4 % measured by XRF corresponds to a salt density of 50 mg/m².

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.