使用10 eV单色氪灯进行紫外光电子能谱分析

IF 3.8 2区 化学 Q1 SPECTROSCOPY
Petr Tsygankov , Eduardo Orozco , Carlos Páez-González , Alejandro David Martínez , Fredy Parada-Becerra
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引用次数: 0

摘要

提出了一种利用温度控制氟化镁滤光片对紫外光电子能谱灯进行单色化的方法。通常,这种技术使用开光路氦放电灯作为光源,需要复杂的差分泵浦系统。介绍了一种简单的替代方案,使用密封的氪谐振灯和独立加热的氟化镁玻璃过滤器。通过将该输出滤波器加热到170-180°C,其短波长透过率限制被移动,选择性地阻挡116.5 nm低强度共振线,同时保持对123.6 nm (10.03 eV)主线的透明度。通过对多晶铜样品的功函数测量验证了该方法,得到的值为4.6±0.1 eV,与文献报道的数据一致。该技术为光谱分析实验室提供了一种更方便、更简单的解决方案,而不会影响测量精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Use of a 10 eV monochromatized krypton lamp for ultraviolet photoelectron spectrometry

Use of a 10 eV monochromatized krypton lamp for ultraviolet photoelectron spectrometry
A method for the monochromation of an ultraviolet lamp for photoelectron spectrometry using a temperature-controlled magnesium fluoride filter is presented. Typically, open optical path helium discharge lamps are used as the light source for this technique, requiring complex differential pumping systems. A simple alternative solution using a sealed krypton resonance lamp with an independently heated magnesium fluoride glass filter is described. By heating the this output filter to 170–180 °C, its short wavelength transmittance limit is shifted, selectively blocking the 116.5 nm low intensity resonance line while maintaining transparency to the main line of 123.6 nm (10.03 eV). Validation of the method through work function measurements on polycrystalline copper samples yielded values of 4.6 ± 0.1 eV, consistent with data reported in the literature. This technique offers a more accessible and less complex solution for spectrometry laboratories without compromising measurement accuracy.
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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