基于m平面h-BN的偏振敏感真空紫外光电探测器（Adv. Mater. 29/2025）

IF 27.4 1区材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY

Advanced Materials Pub Date : 2025-07-24 DOI:10.1002/adma.202570199

Le Chen, Ze Long, Jishan Liu, Lu Liu, Zhongyuan Han, Kexiong Zhang, Hongwei Liang, Hong Yin

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引用次数: 0

摘要

在文章编号2503846中，陈乐，梁红伟，殷红等人开发了具有强各向异性的圆片尺度低对称m面h-BN外延膜，实现了VUV区域的偏振探测。各向异性的m平面h-BN对188 nm偏振光的偏振比为6.2，达到了现有直接检测技术的短波长极限。这项工作展示了一种偏振VUV光电探测器的新策略，为基于传统二维材料的新型集成光电子技术铺平了道路。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Polarization Sensitive Vacuum-Ultraviolet Photodetectors Based on m-Plane h-BN (Adv. Mater. 29/2025)

查看原文本刊更多论文

Polarization Sensitive Vacuum-Ultraviolet Photodetectors Based on m-Plane h-BN (Adv. Mater. 29/2025)

Polarization Sensitive Vacuum-Ultraviolet Photodetectors

In article number 2503846, Le Chen, Hongwei Liang, Hong Yin, and colleagues develop wafer-scale low-symmetry m-plane h-BN epitaxial films with strong anisotropy, achieving polarization detection in the VUV region. The anisotropic m-plane h-BN harvests a polarization ratio of 6.2 for 188 nm polarized light, reaching the short-wavelength limit of existing direct detection technologies. This work demonstrates a novel strategy for polarized VUV photodetectors and paves the way for novel integrated optoelectronics based on traditional 2D materials.

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来源期刊

Advanced Materials 工程技术-材料科学：综合

CiteScore

43.00

自引率

4.10%

发文量

2182

审稿时长

2 months

期刊介绍： Advanced Materials, one of the world's most prestigious journals and the foundation of the Advanced portfolio, is the home of choice for best-in-class materials science for more than 30 years. Following this fast-growing and interdisciplinary field, we are considering and publishing the most important discoveries on any and all materials from materials scientists, chemists, physicists, engineers as well as health and life scientists and bringing you the latest results and trends in modern materials-related research every week.