双栅隧道场效应管不同栅结构工程性能对比分析

Sudha Subhalaxmi Muduli , Ananya Dastidar , Aruna Tripathy , Sukanta Kumar Swain
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引用次数: 0

摘要

通过带对带隧道,隧道场效应晶体管(tfet)减少泄漏和亚阈值摆幅,使其优于MOSFET。然而,传统的晶体管存在双极传导和低导通电流的问题。本文提出了两种增强结构:垂直栅结构双栅TFET和水平栅结构双栅TFET。通过在源端使用高k材料,在漏端使用低k材料,提高了性能。根据使用SILVACO ATLAS进行的模拟,水平栅结构双栅TFET非常适合低功耗,高速应用,因为它具有卓越的跨导性,频率响应和离子/IOFF比。尽管具有更高的阈值电压,垂直栅结构双栅TFET也提高了性能,证明了异质介电工程的好处。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparative performance analysis of different gate structure engineering on double gate tunnel FET
Through band-to-band tunneling, Tunnel Field Effect Transistors (TFETs) reduce leakage and subthreshold swing, giving them an advantage over MOSFET. However, ambipolar conduction and low ON state current are problems with traditional TFET. Two enhanced structures, vertical gate structured double gate TFET and horizontal gate structured double gate TFET are presented in this work. Performance is improved by using a high-k material at the source and a low-κ material at the drain. According to simulations using SILVACO ATLAS, Horizontal gate structured double gate TFET is perfect for low power, high speed applications because it offers superior transconductance, frequency response, and ION/IOFF ratio. Despite having a higher threshold voltage, Vertical gate structured double gate TFET also enhances performance, demonstrating the benefits of hetero dielectric engineering.
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