透射x射线显微镜的定量理论。

IF 2.7 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Beilstein Journal of Nanotechnology Pub Date : 2025-07-15 eCollection Date: 2025-01-01 DOI:10.3762/bjnano.16.82
James G McNally, Christoph Pratsch, Stephan Werner, Stefan Rehbein, Andrew Gibbs, Jihao Wang, Thomas Lunkenbein, Peter Guttmann, Gerd Schneider
{"title":"透射x射线显微镜的定量理论。","authors":"James G McNally, Christoph Pratsch, Stephan Werner, Stefan Rehbein, Andrew Gibbs, Jihao Wang, Thomas Lunkenbein, Peter Guttmann, Gerd Schneider","doi":"10.3762/bjnano.16.82","DOIUrl":null,"url":null,"abstract":"<p><p>Transmission X-ray microscopes (TXMs) are now increasingly used for quantitative analysis of samples, most notably in the spectral analysis of materials. Validating such measurements requires quantitatively accurate models for these microscopes, but current TXM models have only been tested qualitatively. Here we develop an experimental and theoretical framework for evaluation of TXMs that uses Mie theory to compute the electric field emerging from a nanosphere. We approximate the microscope's condenser illumination by plane waves at the mean illumination angle and the zone plate by a thin lens. We find that this model produces good qualitative agreement with our 3D measurements of 60 nm gold nanospheres, but only if both β and δ for the complex refractive index <i>n</i> = 1 - δ + <i>i</i>β of gold are included in the model. This shows that both absorption and phase properties of the specimen influence the acquired TXM image. The qualitative agreement improves if we incorporate a small tilt into the condenser illumination relative to the optical axis, implying a small misalignment in the microscope. Finally, in quantitative comparisons, we show that the model predicts the nanosphere's expected absorption as determined by Beer's law, whereas the microscope underestimates this absorption by 10-20%. This surprising observation highlights the need for future work to identify the microscope feature(s) that lead to this quantitative discrepancy.</p>","PeriodicalId":8802,"journal":{"name":"Beilstein Journal of Nanotechnology","volume":"16 ","pages":"1113-1128"},"PeriodicalIF":2.7000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12278111/pdf/","citationCount":"0","resultStr":"{\"title\":\"Towards a quantitative theory for transmission X-ray microscopy.\",\"authors\":\"James G McNally, Christoph Pratsch, Stephan Werner, Stefan Rehbein, Andrew Gibbs, Jihao Wang, Thomas Lunkenbein, Peter Guttmann, Gerd Schneider\",\"doi\":\"10.3762/bjnano.16.82\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Transmission X-ray microscopes (TXMs) are now increasingly used for quantitative analysis of samples, most notably in the spectral analysis of materials. Validating such measurements requires quantitatively accurate models for these microscopes, but current TXM models have only been tested qualitatively. Here we develop an experimental and theoretical framework for evaluation of TXMs that uses Mie theory to compute the electric field emerging from a nanosphere. We approximate the microscope's condenser illumination by plane waves at the mean illumination angle and the zone plate by a thin lens. We find that this model produces good qualitative agreement with our 3D measurements of 60 nm gold nanospheres, but only if both β and δ for the complex refractive index <i>n</i> = 1 - δ + <i>i</i>β of gold are included in the model. This shows that both absorption and phase properties of the specimen influence the acquired TXM image. The qualitative agreement improves if we incorporate a small tilt into the condenser illumination relative to the optical axis, implying a small misalignment in the microscope. Finally, in quantitative comparisons, we show that the model predicts the nanosphere's expected absorption as determined by Beer's law, whereas the microscope underestimates this absorption by 10-20%. This surprising observation highlights the need for future work to identify the microscope feature(s) that lead to this quantitative discrepancy.</p>\",\"PeriodicalId\":8802,\"journal\":{\"name\":\"Beilstein Journal of Nanotechnology\",\"volume\":\"16 \",\"pages\":\"1113-1128\"},\"PeriodicalIF\":2.7000,\"publicationDate\":\"2025-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12278111/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Beilstein Journal of Nanotechnology\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.3762/bjnano.16.82\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2025/1/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Beilstein Journal of Nanotechnology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.3762/bjnano.16.82","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

透射x射线显微镜(TXMs)现在越来越多地用于样品的定量分析,特别是在材料的光谱分析中。验证这些测量需要这些显微镜的定量精确模型,但目前的TXM模型只进行了定性测试。在这里,我们开发了一个实验和理论框架来评估txm,该框架使用Mie理论来计算纳米球产生的电场。我们用平均照明角的平面波近似显微镜聚光镜的照明,用薄透镜近似带片的照明。我们发现该模型与我们对60 nm金纳米球的三维测量结果有很好的定性一致性,但前提是在模型中同时包含了金的复折射率n = 1 - δ + iβ的β和δ。这表明试样的吸收和相位特性都会影响所获得的TXM图像。如果我们把一个小的倾斜到聚光镜照明相对于光轴,意味着一个小的不对准显微镜,定性协议改善。最后,在定量比较中,我们发现模型预测纳米球的预期吸收是由比尔定律决定的,而显微镜低估了10-20%的吸收。这一令人惊讶的观察结果突出了未来工作的需要,以确定导致这种数量差异的显微镜特征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Towards a quantitative theory for transmission X-ray microscopy.

Transmission X-ray microscopes (TXMs) are now increasingly used for quantitative analysis of samples, most notably in the spectral analysis of materials. Validating such measurements requires quantitatively accurate models for these microscopes, but current TXM models have only been tested qualitatively. Here we develop an experimental and theoretical framework for evaluation of TXMs that uses Mie theory to compute the electric field emerging from a nanosphere. We approximate the microscope's condenser illumination by plane waves at the mean illumination angle and the zone plate by a thin lens. We find that this model produces good qualitative agreement with our 3D measurements of 60 nm gold nanospheres, but only if both β and δ for the complex refractive index n = 1 - δ + iβ of gold are included in the model. This shows that both absorption and phase properties of the specimen influence the acquired TXM image. The qualitative agreement improves if we incorporate a small tilt into the condenser illumination relative to the optical axis, implying a small misalignment in the microscope. Finally, in quantitative comparisons, we show that the model predicts the nanosphere's expected absorption as determined by Beer's law, whereas the microscope underestimates this absorption by 10-20%. This surprising observation highlights the need for future work to identify the microscope feature(s) that lead to this quantitative discrepancy.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.70
自引率
3.20%
发文量
109
审稿时长
2 months
期刊介绍: The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology. The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信