{"title":"螺旋+:用于芯片间链路验证的高效信号功率完整性联合分析","authors":"Xiao Dong;Songyu Sun;Yangfan Jiang;Jingtong Hu;Dawei Gao;Zhiguo Shi;Cheng Zhuo","doi":"10.1109/TCAD.2025.3532822","DOIUrl":null,"url":null,"abstract":"Chiplet technology has recently emerged as a promising solution to improving chip performance through the modularization of complex designs and communication facilitated by high-speed interchiplet serial links. However, the increasing on-package routing density and data rates of these links introduce complex signal and power integrity challenges, surpassing those encountered in traditional large monolithic chips. Addressing these complexities with efficient analysis and design tools is crucial for maintaining design robustness. In this article, we propose SPIRAL+: signal-power integrity co-analysis framework for high-speed interchiplet serial links validation. The framework employs machine learning (ML) to construct transmitter models and utilizes an impulse response extraction method for modeling the channel and receiver. It then performs signal-power integrity co-analysis through a novel double-edge response-based method, leveraging the developed equivalent models. Additionally, an efficient ML model is crafted to accurately predict eye diagram metrics. The analysis provides valuable insights for design optimization. Experimental results show that SPIRAL+ achieves eye diagrams with a mean relative error of 0.07%–7.47%, while realizing a speedup of <inline-formula> <tex-math>$31\\times $ </tex-math></inline-formula>–<inline-formula> <tex-math>$326\\times $ </tex-math></inline-formula> over traditional commercial tools.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"44 8","pages":"3140-3153"},"PeriodicalIF":2.9000,"publicationDate":"2025-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SPIRAL+: Efficient Signal–Power Integrity Co-Analysis for Interchiplet Links Validation\",\"authors\":\"Xiao Dong;Songyu Sun;Yangfan Jiang;Jingtong Hu;Dawei Gao;Zhiguo Shi;Cheng Zhuo\",\"doi\":\"10.1109/TCAD.2025.3532822\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Chiplet technology has recently emerged as a promising solution to improving chip performance through the modularization of complex designs and communication facilitated by high-speed interchiplet serial links. However, the increasing on-package routing density and data rates of these links introduce complex signal and power integrity challenges, surpassing those encountered in traditional large monolithic chips. Addressing these complexities with efficient analysis and design tools is crucial for maintaining design robustness. In this article, we propose SPIRAL+: signal-power integrity co-analysis framework for high-speed interchiplet serial links validation. The framework employs machine learning (ML) to construct transmitter models and utilizes an impulse response extraction method for modeling the channel and receiver. It then performs signal-power integrity co-analysis through a novel double-edge response-based method, leveraging the developed equivalent models. Additionally, an efficient ML model is crafted to accurately predict eye diagram metrics. The analysis provides valuable insights for design optimization. Experimental results show that SPIRAL+ achieves eye diagrams with a mean relative error of 0.07%–7.47%, while realizing a speedup of <inline-formula> <tex-math>$31\\\\times $ </tex-math></inline-formula>–<inline-formula> <tex-math>$326\\\\times $ </tex-math></inline-formula> over traditional commercial tools.\",\"PeriodicalId\":13251,\"journal\":{\"name\":\"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems\",\"volume\":\"44 8\",\"pages\":\"3140-3153\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2025-01-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10849658/\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10849658/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
SPIRAL+: Efficient Signal–Power Integrity Co-Analysis for Interchiplet Links Validation
Chiplet technology has recently emerged as a promising solution to improving chip performance through the modularization of complex designs and communication facilitated by high-speed interchiplet serial links. However, the increasing on-package routing density and data rates of these links introduce complex signal and power integrity challenges, surpassing those encountered in traditional large monolithic chips. Addressing these complexities with efficient analysis and design tools is crucial for maintaining design robustness. In this article, we propose SPIRAL+: signal-power integrity co-analysis framework for high-speed interchiplet serial links validation. The framework employs machine learning (ML) to construct transmitter models and utilizes an impulse response extraction method for modeling the channel and receiver. It then performs signal-power integrity co-analysis through a novel double-edge response-based method, leveraging the developed equivalent models. Additionally, an efficient ML model is crafted to accurately predict eye diagram metrics. The analysis provides valuable insights for design optimization. Experimental results show that SPIRAL+ achieves eye diagrams with a mean relative error of 0.07%–7.47%, while realizing a speedup of $31\times $ –$326\times $ over traditional commercial tools.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.