{"title":"离轴非球面单镜偏转法种子点自动更新迭代重建方法","authors":"Menghui Lan;Bing Li;Xiang Wei;Emanuele Zappa","doi":"10.1109/TIM.2025.3587357","DOIUrl":null,"url":null,"abstract":"The complex surface characteristics and misalignment of the geometric and optical axes of off-axis aspherical surfaces pose major challenges in the work to develop a measurement technique that is accurate, effective, and simple. Phase measurement deflectometry (PMD) is a more convenient and cost-effective method than interferometry for measuring specular objects. Nevertheless, monocular PMD necessitates complicated processes or costly additional equipment to resolve height-slope problems, whereas binocular PMD requires more time-consuming matching calculations. In this article, a novel iterative strategy based on monocular PMD technology with an automatically updated seed point during the iterative process is proposed, which only requires an approximate estimation about the height of one point (either the lowest, middle, or highest) on the measured off-axis aspheric component. The lowest, middle, or highest point of the reconstructed surface is used as the target of the auto-updated seed point in the iterative process, and the surface’s overall height information is then updated until the difference between two neighboring surface profiles is less than a certain threshold. Finally, the off-axis aspherical surface result is sent out. The proposed monocular PMD method is more straightforward, cost-effective, and simple, requiring only basic and low-cost tools to estimate the initial height of the measured component without the need to obtain the seed point’s 3-D coordinate. An experiment was performed to evaluate the feasibility and accuracy of the proposed method with the results of high-precision contact measurements as benchmarks. The results also indicated that even the uncertainty in the estimated initial height using common Vernier calipers has little effect on the measured surface shape, since it only leads to a small offset in the whole surface location.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-12"},"PeriodicalIF":5.6000,"publicationDate":"2025-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Iterative Reconstruction Method With Auto-Updated Seed Point of Monoscopic Deflectometry for Off-Axis Aspheric\",\"authors\":\"Menghui Lan;Bing Li;Xiang Wei;Emanuele Zappa\",\"doi\":\"10.1109/TIM.2025.3587357\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The complex surface characteristics and misalignment of the geometric and optical axes of off-axis aspherical surfaces pose major challenges in the work to develop a measurement technique that is accurate, effective, and simple. Phase measurement deflectometry (PMD) is a more convenient and cost-effective method than interferometry for measuring specular objects. Nevertheless, monocular PMD necessitates complicated processes or costly additional equipment to resolve height-slope problems, whereas binocular PMD requires more time-consuming matching calculations. In this article, a novel iterative strategy based on monocular PMD technology with an automatically updated seed point during the iterative process is proposed, which only requires an approximate estimation about the height of one point (either the lowest, middle, or highest) on the measured off-axis aspheric component. The lowest, middle, or highest point of the reconstructed surface is used as the target of the auto-updated seed point in the iterative process, and the surface’s overall height information is then updated until the difference between two neighboring surface profiles is less than a certain threshold. Finally, the off-axis aspherical surface result is sent out. The proposed monocular PMD method is more straightforward, cost-effective, and simple, requiring only basic and low-cost tools to estimate the initial height of the measured component without the need to obtain the seed point’s 3-D coordinate. An experiment was performed to evaluate the feasibility and accuracy of the proposed method with the results of high-precision contact measurements as benchmarks. The results also indicated that even the uncertainty in the estimated initial height using common Vernier calipers has little effect on the measured surface shape, since it only leads to a small offset in the whole surface location.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":\"74 \",\"pages\":\"1-12\"},\"PeriodicalIF\":5.6000,\"publicationDate\":\"2025-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11075900/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11075900/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Iterative Reconstruction Method With Auto-Updated Seed Point of Monoscopic Deflectometry for Off-Axis Aspheric
The complex surface characteristics and misalignment of the geometric and optical axes of off-axis aspherical surfaces pose major challenges in the work to develop a measurement technique that is accurate, effective, and simple. Phase measurement deflectometry (PMD) is a more convenient and cost-effective method than interferometry for measuring specular objects. Nevertheless, monocular PMD necessitates complicated processes or costly additional equipment to resolve height-slope problems, whereas binocular PMD requires more time-consuming matching calculations. In this article, a novel iterative strategy based on monocular PMD technology with an automatically updated seed point during the iterative process is proposed, which only requires an approximate estimation about the height of one point (either the lowest, middle, or highest) on the measured off-axis aspheric component. The lowest, middle, or highest point of the reconstructed surface is used as the target of the auto-updated seed point in the iterative process, and the surface’s overall height information is then updated until the difference between two neighboring surface profiles is less than a certain threshold. Finally, the off-axis aspherical surface result is sent out. The proposed monocular PMD method is more straightforward, cost-effective, and simple, requiring only basic and low-cost tools to estimate the initial height of the measured component without the need to obtain the seed point’s 3-D coordinate. An experiment was performed to evaluate the feasibility and accuracy of the proposed method with the results of high-precision contact measurements as benchmarks. The results also indicated that even the uncertainty in the estimated initial height using common Vernier calipers has little effect on the measured surface shape, since it only leads to a small offset in the whole surface location.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.