{"title":"结构照明显微镜性能增强技术的最新进展:综述","authors":"Ying Long, Xiaomin Zheng, Yuye Wang, Peng Du, Xinran Li, Jiajie Chen, Yonghong Shao","doi":"10.1016/j.optlaseng.2025.109203","DOIUrl":null,"url":null,"abstract":"<div><div>Structured Illumination Microscopy (SIM) surpasses the diffraction limit by utilizing structured illumination to shift high-frequency information of the sample into the passband of the optical system, enabling super-resolution imaging. With its advantages of low excitation intensity, compatibility with a wide range of fluorescent dyes, and rapid wide-field imaging capabilities, SIM has become a widely adopted technique for super-resolution imaging of living cells. In this review, the working principles, reconstruction methods, and typical experimental setup of conventional SIM are introduced. Recognizing the breadth of the SIM field and its rapid evolution across optics, hardware, and algorithms, the review emphasizes recent advances in optical technologies and hardware innovations, while algorithmic developments, though crucial, receive less detailed coverage. Then, the advancements of wide-field SIM in resolution enhancement, multicolor imaging, and axial resolution improvement are explored. Next, we present the latest development of point-scanning SIM. Finally, the characteristics of different types of SIM are summarized, along with an outlook on future challenges and trends of development in leveraging SIM for various imaging applications.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"194 ","pages":"Article 109203"},"PeriodicalIF":3.5000,"publicationDate":"2025-07-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent advances in Performance Enhancement Technologies for Structured Illumination Microscopy: A Comprehensive Review\",\"authors\":\"Ying Long, Xiaomin Zheng, Yuye Wang, Peng Du, Xinran Li, Jiajie Chen, Yonghong Shao\",\"doi\":\"10.1016/j.optlaseng.2025.109203\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Structured Illumination Microscopy (SIM) surpasses the diffraction limit by utilizing structured illumination to shift high-frequency information of the sample into the passband of the optical system, enabling super-resolution imaging. With its advantages of low excitation intensity, compatibility with a wide range of fluorescent dyes, and rapid wide-field imaging capabilities, SIM has become a widely adopted technique for super-resolution imaging of living cells. In this review, the working principles, reconstruction methods, and typical experimental setup of conventional SIM are introduced. Recognizing the breadth of the SIM field and its rapid evolution across optics, hardware, and algorithms, the review emphasizes recent advances in optical technologies and hardware innovations, while algorithmic developments, though crucial, receive less detailed coverage. Then, the advancements of wide-field SIM in resolution enhancement, multicolor imaging, and axial resolution improvement are explored. Next, we present the latest development of point-scanning SIM. Finally, the characteristics of different types of SIM are summarized, along with an outlook on future challenges and trends of development in leveraging SIM for various imaging applications.</div></div>\",\"PeriodicalId\":49719,\"journal\":{\"name\":\"Optics and Lasers in Engineering\",\"volume\":\"194 \",\"pages\":\"Article 109203\"},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2025-07-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Lasers in Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0143816625003884\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Lasers in Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0143816625003884","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
Recent advances in Performance Enhancement Technologies for Structured Illumination Microscopy: A Comprehensive Review
Structured Illumination Microscopy (SIM) surpasses the diffraction limit by utilizing structured illumination to shift high-frequency information of the sample into the passband of the optical system, enabling super-resolution imaging. With its advantages of low excitation intensity, compatibility with a wide range of fluorescent dyes, and rapid wide-field imaging capabilities, SIM has become a widely adopted technique for super-resolution imaging of living cells. In this review, the working principles, reconstruction methods, and typical experimental setup of conventional SIM are introduced. Recognizing the breadth of the SIM field and its rapid evolution across optics, hardware, and algorithms, the review emphasizes recent advances in optical technologies and hardware innovations, while algorithmic developments, though crucial, receive less detailed coverage. Then, the advancements of wide-field SIM in resolution enhancement, multicolor imaging, and axial resolution improvement are explored. Next, we present the latest development of point-scanning SIM. Finally, the characteristics of different types of SIM are summarized, along with an outlook on future challenges and trends of development in leveraging SIM for various imaging applications.
期刊介绍:
Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods.
Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following:
-Optical Metrology-
Optical Methods for 3D visualization and virtual engineering-
Optical Techniques for Microsystems-
Imaging, Microscopy and Adaptive Optics-
Computational Imaging-
Laser methods in manufacturing-
Integrated optical and photonic sensors-
Optics and Photonics in Life Science-
Hyperspectral and spectroscopic methods-
Infrared and Terahertz techniques