用于优化高功率放大器性能和尺寸的侧源通径hemt

IF 3.4 0 ENGINEERING, ELECTRICAL & ELECTRONIC
Erdem Aras;Emirhan Urfalı;Bayram Bütün;Ekmel Ozbay;Abdullah Atalar
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引用次数: 0

摘要

研究了氮化镓(GaN)-碳化硅(SiC) HEMT的背通定位,以优化射频性能和面积利用率。为每个单独的光源设置一个后通孔可以获得最佳的射频性能,但会导致面积大,宽高比不方便。如果在外部源处只使用两个反过孔,则增加的源电感会降低性能。将源通孔定位在HEMT侧源通孔(SSV)的栅极侧,可以获得更小的源电感和更有利的宽高比。采用SSV hemt和0.25 μ m GaN-on-SiC工艺设计了一种三级单片微波集成电路(MMIC)。该设计在8-12.5 GHz的工作频率范围内实现了超过45 W的输出功率,典型的功率附加效率为40%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
HEMTs With Side-Source-Via for Optimizing the Performance and Size of High-Power Amplifiers
Back-via positioning of a gallium nitride (GaN)-on-silicon carbide (SiC) HEMT is studied to optimize RF performance and area utilization. Placing a back-via for every individual source achieves the best RF performance but results in a large area and an inconvenient aspect ratio. If only two back-vias are used at the outer sources, the increased source inductance reduces the performance. Positioning the source-vias at the gate side of HEMT side-source-via (SSV) results in a smaller source inductance and a more favorable aspect ratio. A three-stage monolithic microwave integrated circuit (MMIC) is designed using SSV HEMTs with a 0.25- $\mu $ m GaN-on-SiC process. The design achieves over 45 W of output power with a typical power-added efficiency of 40% across the operational frequency range of 8–12.5 GHz.
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