{"title":"用于优化高功率放大器性能和尺寸的侧源通径hemt","authors":"Erdem Aras;Emirhan Urfalı;Bayram Bütün;Ekmel Ozbay;Abdullah Atalar","doi":"10.1109/LMWT.2025.3555672","DOIUrl":null,"url":null,"abstract":"Back-via positioning of a gallium nitride (GaN)-on-silicon carbide (SiC) HEMT is studied to optimize RF performance and area utilization. Placing a back-via for every individual source achieves the best RF performance but results in a large area and an inconvenient aspect ratio. If only two back-vias are used at the outer sources, the increased source inductance reduces the performance. Positioning the source-vias at the gate side of HEMT side-source-via (SSV) results in a smaller source inductance and a more favorable aspect ratio. A three-stage monolithic microwave integrated circuit (MMIC) is designed using SSV HEMTs with a 0.25-<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>m GaN-on-SiC process. The design achieves over 45 W of output power with a typical power-added efficiency of 40% across the operational frequency range of 8–12.5 GHz.","PeriodicalId":73297,"journal":{"name":"IEEE microwave and wireless technology letters","volume":"35 7","pages":"1061-1064"},"PeriodicalIF":3.4000,"publicationDate":"2025-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"HEMTs With Side-Source-Via for Optimizing the Performance and Size of High-Power Amplifiers\",\"authors\":\"Erdem Aras;Emirhan Urfalı;Bayram Bütün;Ekmel Ozbay;Abdullah Atalar\",\"doi\":\"10.1109/LMWT.2025.3555672\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Back-via positioning of a gallium nitride (GaN)-on-silicon carbide (SiC) HEMT is studied to optimize RF performance and area utilization. Placing a back-via for every individual source achieves the best RF performance but results in a large area and an inconvenient aspect ratio. If only two back-vias are used at the outer sources, the increased source inductance reduces the performance. Positioning the source-vias at the gate side of HEMT side-source-via (SSV) results in a smaller source inductance and a more favorable aspect ratio. A three-stage monolithic microwave integrated circuit (MMIC) is designed using SSV HEMTs with a 0.25-<inline-formula> <tex-math>$\\\\mu $ </tex-math></inline-formula>m GaN-on-SiC process. The design achieves over 45 W of output power with a typical power-added efficiency of 40% across the operational frequency range of 8–12.5 GHz.\",\"PeriodicalId\":73297,\"journal\":{\"name\":\"IEEE microwave and wireless technology letters\",\"volume\":\"35 7\",\"pages\":\"1061-1064\"},\"PeriodicalIF\":3.4000,\"publicationDate\":\"2025-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE microwave and wireless technology letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10969806/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"0\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE microwave and wireless technology letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10969806/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
摘要
研究了氮化镓(GaN)-碳化硅(SiC) HEMT的背通定位,以优化射频性能和面积利用率。为每个单独的光源设置一个后通孔可以获得最佳的射频性能,但会导致面积大,宽高比不方便。如果在外部源处只使用两个反过孔,则增加的源电感会降低性能。将源通孔定位在HEMT侧源通孔(SSV)的栅极侧,可以获得更小的源电感和更有利的宽高比。采用SSV hemt和0.25 μ m GaN-on-SiC工艺设计了一种三级单片微波集成电路(MMIC)。该设计在8-12.5 GHz的工作频率范围内实现了超过45 W的输出功率,典型的功率附加效率为40%。
HEMTs With Side-Source-Via for Optimizing the Performance and Size of High-Power Amplifiers
Back-via positioning of a gallium nitride (GaN)-on-silicon carbide (SiC) HEMT is studied to optimize RF performance and area utilization. Placing a back-via for every individual source achieves the best RF performance but results in a large area and an inconvenient aspect ratio. If only two back-vias are used at the outer sources, the increased source inductance reduces the performance. Positioning the source-vias at the gate side of HEMT side-source-via (SSV) results in a smaller source inductance and a more favorable aspect ratio. A three-stage monolithic microwave integrated circuit (MMIC) is designed using SSV HEMTs with a 0.25-$\mu $ m GaN-on-SiC process. The design achieves over 45 W of output power with a typical power-added efficiency of 40% across the operational frequency range of 8–12.5 GHz.