基于局部重计算的z变换故障检测方法

IF 2.8 2区 工程技术 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Saeed Aghapour;Kasra Ahmadi;Mehran Mozaffari Kermani;Reza Azarderakhsh
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引用次数: 0

摘要

z变换是一个基本和强大的工具,被广泛应用于信号处理和各种其他应用,如通信和网络。通过分析信号的z变换,可以提取有关其稳定性、因果关系、频率响应、能量和功率以及信号总体行为的关键信息。然而,在大规模集成(VLSI)实现中,由环境变化或恶意注入引起的错误可能严重损害其输出的完整性和可靠性。如果不能检测到这些故障,可能会导致不可预测的、错误的和误导性的功能分析。因此,在接受结果之前检测软错误和故障的能力至关重要。在本文中,我们提出了一种有效的故障检测方法,该方法将算法级检查与部分重新计算相结合,以识别瞬态和永久故障,并在各种注入场景中具有较高的错误覆盖率。我们设计的AMD/Xilinx现场可编程门阵列(FPGA)实现仅显示了时间和面积开销的适度增加。据我们所知,以前还没有研究过z变换函数的故障检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Efficient Partial Recomputation-Based Fault Detection Approaches for Z-transform
The Z-transform is a fundamental and strong tool being widely utilized in signal processing and various other applications such as communications and networking. By analyzing the Z-transform of a signal, one can extract critical information about its stability, causality, frequency response, energy and power, and overall behavior of the signal. However, errors caused either by environmental changes or malicious injections in large-scale integration (VLSI) implementations can critically compromise the integrity and reliability of its output. Failure to detect such faults may result in unpredictable, erroneous, and misleading function analyses. Therefore, the ability to detect soft errors and faults before accepting the results is of paramount importance. In this article, we propose an efficient fault detection method that combines algorithmic-level checks with partial recomputation to identify both transient and permanent faults with a high error coverage rate across various injection scenarios. The AMD/Xilinx field-programmable gate array (FPGA) implementation of our design demonstrated only a modest increase in time and area overhead. To the best of our knowledge, fault detection for the Z-transform function has not been previously studied.
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来源期刊
CiteScore
6.40
自引率
7.10%
发文量
187
审稿时长
3.6 months
期刊介绍: The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society. Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.
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