带平均电压分数阶鉴相器的5 ghz分数阶参考采样锁相环实现整数n级相位噪声

IF 3.4 0 ENGINEERING, ELECTRICAL & ELECTRONIC
Yanlong Zhang;Xiaoyu Yang;Hong Liao;Yan Wang;Guohe Zhang;Li Geng
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引用次数: 0

摘要

提出了一种分数阶鉴相器结构,可以显著降低分数阶锁相环的量化误差。它通过参考采样PD (RSPD)单元阵列在电压域中进行空间平均,实现瞬时分数阶相位检测。利用这种分数PD,在65纳米CMOS工艺中实现了一个5 ghz分数n RSPLL原型。测量结果表明,带内和带外相位噪声分别降低了21和33 dB,导致集成rms抖动从6.35 ps显著降低到456 fs,几乎与整数n模式(442 fs)相同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 5-GHz Fractional-N Reference-Sampling PLL With Voltage-Averaging Fractional Phase Detector Achieving an Integer-N-Level Phase Noise
A fractional phase detector (PD) architecture that can significantly reduce the quantization error of a fractional-N phase-locked loop (PLL) is presented. It achieves instantaneous fractional phase detection by spatial averaging in the voltage domain through an array of reference-sampling PD (RSPD) cells. With this fractional PD, a prototype 5-GHz fractional-N RSPLL is implemented in a 65-nm CMOS process. Measurement results show that the in-band and out-of-band phase noises are reduced by 21 and 33 dB, respectively, leading to a significant reduction of the integrated rms jitter from 6.35 ps to 456 fs, almost the same as that at the integer-N mode (442 fs).
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