Ehsan Nikbin , Dian Yu , Ilya Gourevich , Stas Dogel , R.J. Dwayne Miller , Jane Y. Howe
{"title":"一种新型的法拉第杯的设计和评价,用于在透射电子显微镜中方便和准确地测量光束电流","authors":"Ehsan Nikbin , Dian Yu , Ilya Gourevich , Stas Dogel , R.J. Dwayne Miller , Jane Y. Howe","doi":"10.1016/j.micron.2025.103873","DOIUrl":null,"url":null,"abstract":"<div><div>Beam current measurement is a crucial step in estimating the electron dose when studying beam-sensitive samples in electron microscopy. A Faraday cup is a standard tool for measuring beam current; however, commercially available Faraday cups for transmission electron microscopes (TEM) are limited, expensive, and often difficult to use as the cup itself is invisible in the TEM. We herein present a new Faraday cup design that fits into an insulated TEM holder of Hitachi HT7700 and HT7800 series and can be easily located using four symmetrical through holes around the cup. This design also accommodates the 3 mm TEM mesh grid in the holder and allows both sample imaging and access to the Faraday cup within the TEM stage movement range. We evaluated the effectiveness of our Faraday cup in capturing the electron beam by varying the diameter to depth ratio and material of the Faraday cup through experimental measurements and Monte Carlo simulations, demonstrating an accuracy better than 1–2 %. The preferred configuration is an aluminum cup with a diameter of 0.2 mm and a depth of 0.8 mm. Monte Carlo simulations also suggest that this Faraday cup provides accurate beam current measurement at different electron energies. Our novel Faraday cup design provides a practical, simple, and cost-effective solution for beam current measurement in a TEM.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"196 ","pages":"Article 103873"},"PeriodicalIF":2.2000,"publicationDate":"2025-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and evaluation of a novel Faraday cup for easy and accurate beam current measurement in a transmission electron microscope\",\"authors\":\"Ehsan Nikbin , Dian Yu , Ilya Gourevich , Stas Dogel , R.J. Dwayne Miller , Jane Y. Howe\",\"doi\":\"10.1016/j.micron.2025.103873\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Beam current measurement is a crucial step in estimating the electron dose when studying beam-sensitive samples in electron microscopy. A Faraday cup is a standard tool for measuring beam current; however, commercially available Faraday cups for transmission electron microscopes (TEM) are limited, expensive, and often difficult to use as the cup itself is invisible in the TEM. We herein present a new Faraday cup design that fits into an insulated TEM holder of Hitachi HT7700 and HT7800 series and can be easily located using four symmetrical through holes around the cup. This design also accommodates the 3 mm TEM mesh grid in the holder and allows both sample imaging and access to the Faraday cup within the TEM stage movement range. We evaluated the effectiveness of our Faraday cup in capturing the electron beam by varying the diameter to depth ratio and material of the Faraday cup through experimental measurements and Monte Carlo simulations, demonstrating an accuracy better than 1–2 %. The preferred configuration is an aluminum cup with a diameter of 0.2 mm and a depth of 0.8 mm. Monte Carlo simulations also suggest that this Faraday cup provides accurate beam current measurement at different electron energies. Our novel Faraday cup design provides a practical, simple, and cost-effective solution for beam current measurement in a TEM.</div></div>\",\"PeriodicalId\":18501,\"journal\":{\"name\":\"Micron\",\"volume\":\"196 \",\"pages\":\"Article 103873\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2025-07-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micron\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0968432825000915\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0968432825000915","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
Design and evaluation of a novel Faraday cup for easy and accurate beam current measurement in a transmission electron microscope
Beam current measurement is a crucial step in estimating the electron dose when studying beam-sensitive samples in electron microscopy. A Faraday cup is a standard tool for measuring beam current; however, commercially available Faraday cups for transmission electron microscopes (TEM) are limited, expensive, and often difficult to use as the cup itself is invisible in the TEM. We herein present a new Faraday cup design that fits into an insulated TEM holder of Hitachi HT7700 and HT7800 series and can be easily located using four symmetrical through holes around the cup. This design also accommodates the 3 mm TEM mesh grid in the holder and allows both sample imaging and access to the Faraday cup within the TEM stage movement range. We evaluated the effectiveness of our Faraday cup in capturing the electron beam by varying the diameter to depth ratio and material of the Faraday cup through experimental measurements and Monte Carlo simulations, demonstrating an accuracy better than 1–2 %. The preferred configuration is an aluminum cup with a diameter of 0.2 mm and a depth of 0.8 mm. Monte Carlo simulations also suggest that this Faraday cup provides accurate beam current measurement at different electron energies. Our novel Faraday cup design provides a practical, simple, and cost-effective solution for beam current measurement in a TEM.
期刊介绍:
Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.