{"title":"waam制造ER70S-6钢构件表面粗糙度优化","authors":"Shang-Pang Yu , Jheng-Syun Jhong","doi":"10.1016/j.matlet.2025.139024","DOIUrl":null,"url":null,"abstract":"<div><div>This study proposes a cost-effective and practically applicable process optimization strategy for improving surface quality in WAAM using ER70S-6 solid wire. A Taguchi L9 orthogonal array was employed to systematically investigate the effects of three process parameters, travel speed, current, and voltage on the areal surface roughness of deposited walls. Interpass temperatures were monitored using an infrared thermal camera to evaluate thermal accumulation. The results revealed that a parameter combination of 20 cm/min travel speed, 130 A current, and 19 V voltage, coupled with a stabilized interpass temperature of approximately 250 °C, significantly reduced thermal buildup and enhanced surface morphology, yielding a minimum S<sub>a</sub> of 187 μm. The optimized parameters were further validated through the fabrication of a geometric structure. The findings confirmed that interpass dwell time contributes to improved local surface flatness and verified the stability and feasibility of the selected parameters. This work not only demonstrates a practical pathway to surface improvement in low-alloy WAAM components but also provides a useful reference for surface quality control and thermal management strategies in WAAM processes.</div></div>","PeriodicalId":384,"journal":{"name":"Materials Letters","volume":"399 ","pages":"Article 139024"},"PeriodicalIF":2.7000,"publicationDate":"2025-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimization of surface roughness in WAAM-fabricated ER70S-6 steel components\",\"authors\":\"Shang-Pang Yu , Jheng-Syun Jhong\",\"doi\":\"10.1016/j.matlet.2025.139024\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>This study proposes a cost-effective and practically applicable process optimization strategy for improving surface quality in WAAM using ER70S-6 solid wire. A Taguchi L9 orthogonal array was employed to systematically investigate the effects of three process parameters, travel speed, current, and voltage on the areal surface roughness of deposited walls. Interpass temperatures were monitored using an infrared thermal camera to evaluate thermal accumulation. The results revealed that a parameter combination of 20 cm/min travel speed, 130 A current, and 19 V voltage, coupled with a stabilized interpass temperature of approximately 250 °C, significantly reduced thermal buildup and enhanced surface morphology, yielding a minimum S<sub>a</sub> of 187 μm. The optimized parameters were further validated through the fabrication of a geometric structure. The findings confirmed that interpass dwell time contributes to improved local surface flatness and verified the stability and feasibility of the selected parameters. This work not only demonstrates a practical pathway to surface improvement in low-alloy WAAM components but also provides a useful reference for surface quality control and thermal management strategies in WAAM processes.</div></div>\",\"PeriodicalId\":384,\"journal\":{\"name\":\"Materials Letters\",\"volume\":\"399 \",\"pages\":\"Article 139024\"},\"PeriodicalIF\":2.7000,\"publicationDate\":\"2025-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Letters\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167577X25010535\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Letters","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167577X25010535","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Optimization of surface roughness in WAAM-fabricated ER70S-6 steel components
This study proposes a cost-effective and practically applicable process optimization strategy for improving surface quality in WAAM using ER70S-6 solid wire. A Taguchi L9 orthogonal array was employed to systematically investigate the effects of three process parameters, travel speed, current, and voltage on the areal surface roughness of deposited walls. Interpass temperatures were monitored using an infrared thermal camera to evaluate thermal accumulation. The results revealed that a parameter combination of 20 cm/min travel speed, 130 A current, and 19 V voltage, coupled with a stabilized interpass temperature of approximately 250 °C, significantly reduced thermal buildup and enhanced surface morphology, yielding a minimum Sa of 187 μm. The optimized parameters were further validated through the fabrication of a geometric structure. The findings confirmed that interpass dwell time contributes to improved local surface flatness and verified the stability and feasibility of the selected parameters. This work not only demonstrates a practical pathway to surface improvement in low-alloy WAAM components but also provides a useful reference for surface quality control and thermal management strategies in WAAM processes.
期刊介绍:
Materials Letters has an open access mirror journal Materials Letters: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
Materials Letters is dedicated to publishing novel, cutting edge reports of broad interest to the materials community. The journal provides a forum for materials scientists and engineers, physicists, and chemists to rapidly communicate on the most important topics in the field of materials.
Contributions include, but are not limited to, a variety of topics such as:
• Materials - Metals and alloys, amorphous solids, ceramics, composites, polymers, semiconductors
• Applications - Structural, opto-electronic, magnetic, medical, MEMS, sensors, smart
• Characterization - Analytical, microscopy, scanning probes, nanoscopic, optical, electrical, magnetic, acoustic, spectroscopic, diffraction
• Novel Materials - Micro and nanostructures (nanowires, nanotubes, nanoparticles), nanocomposites, thin films, superlattices, quantum dots.
• Processing - Crystal growth, thin film processing, sol-gel processing, mechanical processing, assembly, nanocrystalline processing.
• Properties - Mechanical, magnetic, optical, electrical, ferroelectric, thermal, interfacial, transport, thermodynamic
• Synthesis - Quenching, solid state, solidification, solution synthesis, vapor deposition, high pressure, explosive