{"title":"基于图形神经网络的设计异常预测器","authors":"Sagar Satapathy, Dip Sankar Banerjee","doi":"10.1016/j.vlsi.2025.102452","DOIUrl":null,"url":null,"abstract":"<div><div>Several design issues detected in the physical design stages of the Application Specific Integrated Circuits (ASIC) flow are attributed to poorly written Register Transfer Level (RTL) codes. Such issues are complex to resolve using iterative synthesis, placement optimization and engineering change orders (ECOs). As a result, design closure is delayed, impacting the overall timeline of the chip tape-out. Detection of such RTL constructs early in the design flow can help tackle the downstream issues in the physical design stages like congestion hotspots, high cell/pin density in the core area, timing degradation and timing design rule violations. This work presents a graph learning based approach to detect such design anomalies in the RTL. GATOR, a synthesis tool-independent, parameterized, and customizable framework to detect design anomalies, is presented. It allows flexibility in model generation based on the degree of strictness set by the ASIC designers. This GNN-based approach is highly accurate in detecting RTL design anomalies, with an average accuracy of 98.62% for the most strict threshold combination and an average inference time of 2.75 s, resulting in a speedup of 8.59<span><math><mo>×</mo></math></span> compared to algorithm-based checks presented in this work to determine the design anomalies, which can reduce multiple iterations in the physical design stages.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"104 ","pages":"Article 102452"},"PeriodicalIF":2.2000,"publicationDate":"2025-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"GATOR: A Graph Neural Network based Design Anomaly Predictor\",\"authors\":\"Sagar Satapathy, Dip Sankar Banerjee\",\"doi\":\"10.1016/j.vlsi.2025.102452\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Several design issues detected in the physical design stages of the Application Specific Integrated Circuits (ASIC) flow are attributed to poorly written Register Transfer Level (RTL) codes. Such issues are complex to resolve using iterative synthesis, placement optimization and engineering change orders (ECOs). As a result, design closure is delayed, impacting the overall timeline of the chip tape-out. Detection of such RTL constructs early in the design flow can help tackle the downstream issues in the physical design stages like congestion hotspots, high cell/pin density in the core area, timing degradation and timing design rule violations. This work presents a graph learning based approach to detect such design anomalies in the RTL. GATOR, a synthesis tool-independent, parameterized, and customizable framework to detect design anomalies, is presented. It allows flexibility in model generation based on the degree of strictness set by the ASIC designers. This GNN-based approach is highly accurate in detecting RTL design anomalies, with an average accuracy of 98.62% for the most strict threshold combination and an average inference time of 2.75 s, resulting in a speedup of 8.59<span><math><mo>×</mo></math></span> compared to algorithm-based checks presented in this work to determine the design anomalies, which can reduce multiple iterations in the physical design stages.</div></div>\",\"PeriodicalId\":54973,\"journal\":{\"name\":\"Integration-The Vlsi Journal\",\"volume\":\"104 \",\"pages\":\"Article 102452\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2025-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Integration-The Vlsi Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167926025001099\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025001099","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
GATOR: A Graph Neural Network based Design Anomaly Predictor
Several design issues detected in the physical design stages of the Application Specific Integrated Circuits (ASIC) flow are attributed to poorly written Register Transfer Level (RTL) codes. Such issues are complex to resolve using iterative synthesis, placement optimization and engineering change orders (ECOs). As a result, design closure is delayed, impacting the overall timeline of the chip tape-out. Detection of such RTL constructs early in the design flow can help tackle the downstream issues in the physical design stages like congestion hotspots, high cell/pin density in the core area, timing degradation and timing design rule violations. This work presents a graph learning based approach to detect such design anomalies in the RTL. GATOR, a synthesis tool-independent, parameterized, and customizable framework to detect design anomalies, is presented. It allows flexibility in model generation based on the degree of strictness set by the ASIC designers. This GNN-based approach is highly accurate in detecting RTL design anomalies, with an average accuracy of 98.62% for the most strict threshold combination and an average inference time of 2.75 s, resulting in a speedup of 8.59 compared to algorithm-based checks presented in this work to determine the design anomalies, which can reduce multiple iterations in the physical design stages.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.