用于SIMS硫同位素分析的两种新的重晶石基准物质:晶体取向效应和均匀性的评价

IF 3.1 2区 化学 Q2 CHEMISTRY, ANALYTICAL
Lan-Lan Tian, Xiao-Lei Wang, Yue Guan, Wen-Li Xie, Kexin Xu, Feng-Tai Tong, Tao Yang and Yong-Bo Peng
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引用次数: 0

摘要

重晶石是重建整个地质历史中硫循环演化的重要档案。重晶石硫同位素组成(δ34S)的微尺度空间变化为研究重晶石沉淀过程提供了有价值的信息。虽然次级离子质谱(SIMS)微分析已成为此类研究的有力工具,但高质量参考物质的可用性仍然是准确测量的基本要求。虽然已经开发了几种用于SIMS分析的重晶石参考物质,但晶体取向对硫同位素测量的潜在影响尚未得到系统评估。此外,开发更多具有不同硫同位素组成的原位重晶石标准物质将极大地促进跨实验室数据的比较。在这项研究中,我们结合电子背散射衍射(EBSD)和SIMS分析对晶体取向效应进行了全面的研究。我们的研究结果表明,在当前的分析精度水平下,晶体取向在SIMS重晶石硫同位素测量中不会产生显著的分析偏差。此外,我们提出了两种新的具有良好表征的潜在参考物质NJU-Ba-1和NJU-Ba-2重晶石,专门用于微束硫同位素分析。纹理和主要元素组成的详细表征证实了两个重晶石标本的地面碎片中没有内部分带。采用气源同位素质谱法(GS-IRMS)测定NJU-Ba-1和NJU-Ba-2的δ34SV-CDT标准值分别为6.18±0.34‰(2SD, N = 17)和14.16±0.26‰(2SD, N = 9),建立了扩展的δ34SV-CDT标准范围。广泛的SIMS分析显示,NJU-Ba-1和NJU-Ba-2的δ34S变化幅度分别为0.36‰(2SD, N = 328)和0.45‰(2SD, N = 343)。这些性能特征表明NJU-Ba-1和NJU-Ba-2是重晶石硫同位素高精度微量分析研究的理想参考物质。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Two new barite reference materials for SIMS sulfur isotope analysis: evaluation of the crystallographic orientation effect and homogeneity†

Two new barite reference materials for SIMS sulfur isotope analysis: evaluation of the crystallographic orientation effect and homogeneity†

Barite serves as a crucial archive for reconstructing sulfur cycling evolution throughout geologic history. Microscale space variations in sulfur isotope compositions (δ34S) of barite provide valuable insights into the barite precipitation process. While secondary ion mass spectrometry (SIMS) microanalysis has emerged as a powerful tool for such investigations, the availability of high quality reference materials remains a fundamental requirement for accurate measurements. Although several barite reference materials have been developed for SIMS analysis, the potential influence of crystallographic orientation on sulfur isotope measurements has not been systematically evaluated. Moreover, the development of more in situ barite reference materials with diverse sulfur isotopic compositions would greatly facilitate cross-laboratory data comparison. In this study, we conducted a comprehensive investigation of the crystallographic orientation effect by combining electron backscatter diffraction (EBSD) and SIMS analyses. Our results demonstrate that crystallographic orientation does not produce significant analytical bias in SIMS barite sulfur isotope measurements at current levels of analytical precision. Furthermore, we present two new well-characterized potential reference materials NJU-Ba-1 and NJU-Ba-2 barite specifically developed for microbeam sulfur isotope analysis. Detailed characterization of texture and major element composition confirms the absence of internal zoning in ground fragments from both barite specimens. These two reference materials establish an extended δ34SV-CDT calibration range for microanalytical studies, with certified values of 6.18 ± 0.34‰ (2SD, N = 17) and 14.16 ± 0.26‰ (2SD, N = 9) for NJU-Ba-1 and NJU-Ba-2 respectively, as determined by gas-source isotope ratio mass spectrometry (GS-IRMS). Extensive SIMS analyses revealed exceptional homogeneity at both inter- and intra-unit scales, with δ34S variations of 0.36‰ (2SD, N = 328) for NJU-Ba-1 and 0.45‰ (2SD, N = 343) for NJU-Ba-2. These performance characteristics indicate that NJU-Ba-1 and NJU-Ba-2 are promising candidates as reference materials for high-precision microanalytical studies of barite sulfur isotopes.

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来源期刊
CiteScore
6.20
自引率
26.50%
发文量
228
审稿时长
1.7 months
期刊介绍: Innovative research on the fundamental theory and application of spectrometric techniques.
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