Alanna M Klose,Joseph D Katz,Robert Boni,David Nelson,Brian Hassard,Benjamin L Miller
{"title":"λ θ反射法:一种测量平面蛋白质阵列光学膜厚度的新技术。","authors":"Alanna M Klose,Joseph D Katz,Robert Boni,David Nelson,Brian Hassard,Benjamin L Miller","doi":"10.1021/acssensors.5c01108","DOIUrl":null,"url":null,"abstract":"Quantitative protein measurements provide valuable information about biological pathways, immune system functionality, and the mechanisms of disease. The most accurate methods for detecting proteins are label-free and preserve native protein-binding interactions. Label-free biomolecular interaction analysis includes reflectometry, a group of techniques that detect proteins by measuring the reflectance properties of a thin film on a substrate. Most of these techniques are limited in some way by instrument complexity, sensitivity, or consumable manufacturing requirements. To address these issues, we introduce Lambda Theta Reflectometry (LTR), a new reflectometric technique that measures changes in film thickness by determining the point of null reflectivity as a function of wavelength (lambda) and angle of incidence (theta). The substrate is simultaneously illuminated with a range of angles and wavelengths, and reflected light is resolved both angularly and spectrally. Our prototype LTR reflectometer can measure SiO2 layer thickness with milli-Ångström precision. LTR measurements of Si/SiO2 oxide films are in excellent agreement with spectroscopic ellipsometry for film thicknesses ranging from 1390 to 1465 Å. This technique enables label-free biosensing measurements across a range of biological analyte concentrations (0.5 ng/mL to μg/mL) without requiring stringent control over probe deposition thickness or substrate manufacturing.","PeriodicalId":24,"journal":{"name":"ACS Sensors","volume":"3 1","pages":""},"PeriodicalIF":9.1000,"publicationDate":"2025-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Lambda Theta Reflectometry: A New Technique for Measuring Optical Film Thickness in Planar Protein Arrays.\",\"authors\":\"Alanna M Klose,Joseph D Katz,Robert Boni,David Nelson,Brian Hassard,Benjamin L Miller\",\"doi\":\"10.1021/acssensors.5c01108\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantitative protein measurements provide valuable information about biological pathways, immune system functionality, and the mechanisms of disease. The most accurate methods for detecting proteins are label-free and preserve native protein-binding interactions. Label-free biomolecular interaction analysis includes reflectometry, a group of techniques that detect proteins by measuring the reflectance properties of a thin film on a substrate. Most of these techniques are limited in some way by instrument complexity, sensitivity, or consumable manufacturing requirements. To address these issues, we introduce Lambda Theta Reflectometry (LTR), a new reflectometric technique that measures changes in film thickness by determining the point of null reflectivity as a function of wavelength (lambda) and angle of incidence (theta). The substrate is simultaneously illuminated with a range of angles and wavelengths, and reflected light is resolved both angularly and spectrally. Our prototype LTR reflectometer can measure SiO2 layer thickness with milli-Ångström precision. LTR measurements of Si/SiO2 oxide films are in excellent agreement with spectroscopic ellipsometry for film thicknesses ranging from 1390 to 1465 Å. This technique enables label-free biosensing measurements across a range of biological analyte concentrations (0.5 ng/mL to μg/mL) without requiring stringent control over probe deposition thickness or substrate manufacturing.\",\"PeriodicalId\":24,\"journal\":{\"name\":\"ACS Sensors\",\"volume\":\"3 1\",\"pages\":\"\"},\"PeriodicalIF\":9.1000,\"publicationDate\":\"2025-07-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Sensors\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://doi.org/10.1021/acssensors.5c01108\",\"RegionNum\":1,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"CHEMISTRY, ANALYTICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Sensors","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1021/acssensors.5c01108","RegionNum":1,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, ANALYTICAL","Score":null,"Total":0}
Lambda Theta Reflectometry: A New Technique for Measuring Optical Film Thickness in Planar Protein Arrays.
Quantitative protein measurements provide valuable information about biological pathways, immune system functionality, and the mechanisms of disease. The most accurate methods for detecting proteins are label-free and preserve native protein-binding interactions. Label-free biomolecular interaction analysis includes reflectometry, a group of techniques that detect proteins by measuring the reflectance properties of a thin film on a substrate. Most of these techniques are limited in some way by instrument complexity, sensitivity, or consumable manufacturing requirements. To address these issues, we introduce Lambda Theta Reflectometry (LTR), a new reflectometric technique that measures changes in film thickness by determining the point of null reflectivity as a function of wavelength (lambda) and angle of incidence (theta). The substrate is simultaneously illuminated with a range of angles and wavelengths, and reflected light is resolved both angularly and spectrally. Our prototype LTR reflectometer can measure SiO2 layer thickness with milli-Ångström precision. LTR measurements of Si/SiO2 oxide films are in excellent agreement with spectroscopic ellipsometry for film thicknesses ranging from 1390 to 1465 Å. This technique enables label-free biosensing measurements across a range of biological analyte concentrations (0.5 ng/mL to μg/mL) without requiring stringent control over probe deposition thickness or substrate manufacturing.
期刊介绍:
ACS Sensors is a peer-reviewed research journal that focuses on the dissemination of new and original knowledge in the field of sensor science, particularly those that selectively sense chemical or biological species or processes. The journal covers a broad range of topics, including but not limited to biosensors, chemical sensors, gas sensors, intracellular sensors, single molecule sensors, cell chips, and microfluidic devices. It aims to publish articles that address conceptual advances in sensing technology applicable to various types of analytes or application papers that report on the use of existing sensing concepts in new ways or for new analytes.