Hao Yan , Yaning Jia , Chuangyuan Zeng , Xiaoping Liao , Xiao Shi
{"title":"考虑不确定性的射频MEMS开关鲁棒优化算法","authors":"Hao Yan , Yaning Jia , Chuangyuan Zeng , Xiaoping Liao , Xiao Shi","doi":"10.1016/j.vlsi.2025.102470","DOIUrl":null,"url":null,"abstract":"<div><div>Efficient robust design of RF MEMS switches requires balancing stringent performance criteria with inherent uncertainties. This paper proposes a Comprehensive Robust MEMS Optimization (CRMO) framework that integrates a Surrogate-assisted Differential Evolution with Screening Constraints (SDESC) and a Surrogate-assisted Multi-Objective Worst-case (SMOW) analysis method using both global and local regression models with particle swarm optimization (PSO). The SDESC algorithm adaptively adjusts constraint evaluations based on the proportion of feasible solutions, significantly reducing computational overhead, while SMOW efficiently handles multi-objective worst-case scenarios. Experimental evaluations on a 35 GHz series switch and an 10 GHz shunt switch demonstrate substantial performance and efficiency improvements. Specifically, for the series switch, the worst-case insertion loss improved from −6.742 dB to −0.134 dB, and the driving voltage was reduced from 58.345 V to 37.933 V; for the shunt switch, isolation was enhanced from −9.586 dB to −18.853 dB. Furthermore, the proposed algorithm achieves speedup from 3.2 × to 45 × over traditional PSO methods, confirming its advantage in both robustness and computational efficiency.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"104 ","pages":"Article 102470"},"PeriodicalIF":2.2000,"publicationDate":"2025-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Robust optimization algorithm of RF MEMS switches considering uncertainties\",\"authors\":\"Hao Yan , Yaning Jia , Chuangyuan Zeng , Xiaoping Liao , Xiao Shi\",\"doi\":\"10.1016/j.vlsi.2025.102470\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Efficient robust design of RF MEMS switches requires balancing stringent performance criteria with inherent uncertainties. This paper proposes a Comprehensive Robust MEMS Optimization (CRMO) framework that integrates a Surrogate-assisted Differential Evolution with Screening Constraints (SDESC) and a Surrogate-assisted Multi-Objective Worst-case (SMOW) analysis method using both global and local regression models with particle swarm optimization (PSO). The SDESC algorithm adaptively adjusts constraint evaluations based on the proportion of feasible solutions, significantly reducing computational overhead, while SMOW efficiently handles multi-objective worst-case scenarios. Experimental evaluations on a 35 GHz series switch and an 10 GHz shunt switch demonstrate substantial performance and efficiency improvements. Specifically, for the series switch, the worst-case insertion loss improved from −6.742 dB to −0.134 dB, and the driving voltage was reduced from 58.345 V to 37.933 V; for the shunt switch, isolation was enhanced from −9.586 dB to −18.853 dB. Furthermore, the proposed algorithm achieves speedup from 3.2 × to 45 × over traditional PSO methods, confirming its advantage in both robustness and computational efficiency.</div></div>\",\"PeriodicalId\":54973,\"journal\":{\"name\":\"Integration-The Vlsi Journal\",\"volume\":\"104 \",\"pages\":\"Article 102470\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2025-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Integration-The Vlsi Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167926025001270\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025001270","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Robust optimization algorithm of RF MEMS switches considering uncertainties
Efficient robust design of RF MEMS switches requires balancing stringent performance criteria with inherent uncertainties. This paper proposes a Comprehensive Robust MEMS Optimization (CRMO) framework that integrates a Surrogate-assisted Differential Evolution with Screening Constraints (SDESC) and a Surrogate-assisted Multi-Objective Worst-case (SMOW) analysis method using both global and local regression models with particle swarm optimization (PSO). The SDESC algorithm adaptively adjusts constraint evaluations based on the proportion of feasible solutions, significantly reducing computational overhead, while SMOW efficiently handles multi-objective worst-case scenarios. Experimental evaluations on a 35 GHz series switch and an 10 GHz shunt switch demonstrate substantial performance and efficiency improvements. Specifically, for the series switch, the worst-case insertion loss improved from −6.742 dB to −0.134 dB, and the driving voltage was reduced from 58.345 V to 37.933 V; for the shunt switch, isolation was enhanced from −9.586 dB to −18.853 dB. Furthermore, the proposed algorithm achieves speedup from 3.2 × to 45 × over traditional PSO methods, confirming its advantage in both robustness and computational efficiency.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.