SOI电吸收调制器上III-V的模拟表征

IF 2.3 3区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Photonics Technology Letters Pub Date : 2025-06-10 DOI:10.1109/LPT.2025.3578407

Akeem Safiriyu;Amin Souleiman;Salim Faci;Anne-Laure Billabert;Catherine Algani;Joan Ramirez

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引用次数: 0

摘要

本文描述了两个异构集成III-V型电吸收调制器（eam）在SOI上的模拟性能，它们的长度分别为$150~\ mathm {\mu m}$和$200~\ mathm {\mu m}$。在反向偏置电压为3 V时，两个EAM的消光比分别为8.7 dB和15 dB，在0 V时，较长的EAM的最大斜率效率为$~1.97~\mathrm {V^{-1}}$。测量了这些eam的二阶和三阶无杂散动态范围，比较了偏置电压变化和激光波长失谐对其动态范围的影响。

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Analog Characterization of III-V on SOI Electro-Absorption Modulators

This letter describes the analog performance of two heterogeneous integrated III-V Electro-Absorption Modulators (EAMs) on SOI with lengths of

$150~\mathrm {\mu m}$

and

$200~\mathrm {\mu m}$

. Extinction ratios of 8.7 dB and 15 dB were measured in both EAMs under 3 V reverse bias voltage, with a maximum slope efficiency of

$~1.97~\mathrm {V^{-1}}$

in the longer EAM at 0 V. The second and third order spurious-free dynamic range of these EAMs were measured to compare how their dynamic ranges are impacted due to change in bias voltage and laser wavelength detuning.

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来源期刊

IEEE Photonics Technology Letters 工程技术-工程：电子与电气

CiteScore

5.00

自引率

3.80%

发文量

404

审稿时长

2.0 months

期刊介绍： IEEE Photonics Technology Letters addresses all aspects of the IEEE Photonics Society Constitutional Field of Interest with emphasis on photonic/lightwave components and applications, laser physics and systems and laser/electro-optics technology. Examples of subject areas for the above areas of concentration are integrated optic and optoelectronic devices, high-power laser arrays (e.g. diode, CO2), free electron lasers, solid, state lasers, laser materials'' interactions and femtosecond laser techniques. The letters journal publishes engineering, applied physics and physics oriented papers. Emphasis is on rapid publication of timely manuscripts. A goal is to provide a focal point of quality engineering-oriented papers in the electro-optics field not found in other rapid-publication journals.