基于传输优化电压增强增材制造实验室x射线计算机断层扫描图像对比度

IF 4.5 2区 材料科学 Q1 MATERIALS SCIENCE, CHARACTERIZATION & TESTING
Jiasheng Liu , Xu Qiao , Ke Gong , Fanqiang Meng , Chenggong Zhang , Zhou Zhou
{"title":"基于传输优化电压增强增材制造实验室x射线计算机断层扫描图像对比度","authors":"Jiasheng Liu ,&nbsp;Xu Qiao ,&nbsp;Ke Gong ,&nbsp;Fanqiang Meng ,&nbsp;Chenggong Zhang ,&nbsp;Zhou Zhou","doi":"10.1016/j.ndteint.2025.103462","DOIUrl":null,"url":null,"abstract":"<div><div>Laboratory X-ray computed tomography (XCT) becomes widely used in the field of additive manufacturing (AM) for defects inspection. However, the voltage of X-ray source, which determines the X-ray transmission through a certain sample, used in XCT experiments is significantly discrepant. The effects on the quality of resulting images have not been studied and discussed in AM field. In this work, the theoretical transmissions of monochromatic and polychromatic X-rays for various SLM-prepared samples were calculated and successfully validated by both synchrotron and laboratory XCT experimentally. The laboratory XCT images obtained with various voltages were evaluated in detail, and the optimal contrast was achieved when the transmission difference between the materials with and without pores was maximum. Thus, this study proposed a transmission-based method to improve image contrast by optimizing the voltage setting in laboratory XCT.</div></div>","PeriodicalId":18868,"journal":{"name":"Ndt & E International","volume":"156 ","pages":"Article 103462"},"PeriodicalIF":4.5000,"publicationDate":"2025-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhanced image contrast in laboratory X-ray computed tomography for additive manufacturing by optimizing voltage based on transmission\",\"authors\":\"Jiasheng Liu ,&nbsp;Xu Qiao ,&nbsp;Ke Gong ,&nbsp;Fanqiang Meng ,&nbsp;Chenggong Zhang ,&nbsp;Zhou Zhou\",\"doi\":\"10.1016/j.ndteint.2025.103462\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Laboratory X-ray computed tomography (XCT) becomes widely used in the field of additive manufacturing (AM) for defects inspection. However, the voltage of X-ray source, which determines the X-ray transmission through a certain sample, used in XCT experiments is significantly discrepant. The effects on the quality of resulting images have not been studied and discussed in AM field. In this work, the theoretical transmissions of monochromatic and polychromatic X-rays for various SLM-prepared samples were calculated and successfully validated by both synchrotron and laboratory XCT experimentally. The laboratory XCT images obtained with various voltages were evaluated in detail, and the optimal contrast was achieved when the transmission difference between the materials with and without pores was maximum. Thus, this study proposed a transmission-based method to improve image contrast by optimizing the voltage setting in laboratory XCT.</div></div>\",\"PeriodicalId\":18868,\"journal\":{\"name\":\"Ndt & E International\",\"volume\":\"156 \",\"pages\":\"Article 103462\"},\"PeriodicalIF\":4.5000,\"publicationDate\":\"2025-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ndt & E International\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0963869525001434\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, CHARACTERIZATION & TESTING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ndt & E International","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0963869525001434","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}
引用次数: 0

摘要

实验室x射线计算机断层扫描(XCT)被广泛应用于增材制造(AM)领域的缺陷检测。然而,在XCT实验中,决定x射线通过某一样品透射率的x射线源电压存在显著差异。对成像质量的影响在AM领域还没有被研究和讨论。在这项工作中,计算了各种slm制备的样品的单色和多色x射线的理论传输,并通过同步加速器和实验室XCT实验成功地验证了这一点。对不同电压下获得的实验室XCT图像进行了详细评价,当有孔和无孔材料之间的透射差最大时,对比度达到最佳。因此,本研究提出了一种基于传输的方法,通过优化实验室XCT的电压设置来提高图像对比度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Enhanced image contrast in laboratory X-ray computed tomography for additive manufacturing by optimizing voltage based on transmission

Enhanced image contrast in laboratory X-ray computed tomography for additive manufacturing by optimizing voltage based on transmission
Laboratory X-ray computed tomography (XCT) becomes widely used in the field of additive manufacturing (AM) for defects inspection. However, the voltage of X-ray source, which determines the X-ray transmission through a certain sample, used in XCT experiments is significantly discrepant. The effects on the quality of resulting images have not been studied and discussed in AM field. In this work, the theoretical transmissions of monochromatic and polychromatic X-rays for various SLM-prepared samples were calculated and successfully validated by both synchrotron and laboratory XCT experimentally. The laboratory XCT images obtained with various voltages were evaluated in detail, and the optimal contrast was achieved when the transmission difference between the materials with and without pores was maximum. Thus, this study proposed a transmission-based method to improve image contrast by optimizing the voltage setting in laboratory XCT.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Ndt & E International
Ndt & E International 工程技术-材料科学:表征与测试
CiteScore
7.20
自引率
9.50%
发文量
121
审稿时长
55 days
期刊介绍: NDT&E international publishes peer-reviewed results of original research and development in all categories of the fields of nondestructive testing and evaluation including ultrasonics, electromagnetics, radiography, optical and thermal methods. In addition to traditional NDE topics, the emerging technology area of inspection of civil structures and materials is also emphasized. The journal publishes original papers on research and development of new inspection techniques and methods, as well as on novel and innovative applications of established methods. Papers on NDE sensors and their applications both for inspection and process control, as well as papers describing novel NDE systems for structural health monitoring and their performance in industrial settings are also considered. Other regular features include international news, new equipment and a calendar of forthcoming worldwide meetings. This journal is listed in Current Contents.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信