Jinjing Zhang , Liping Lian , Pengcheng Yang , Mingyan Sun , Yin Zhang , Yuan Xiao
{"title":"斜入射激光干涉仪测量螺旋表面形貌的几何畸变校正","authors":"Jinjing Zhang , Liping Lian , Pengcheng Yang , Mingyan Sun , Yin Zhang , Yuan Xiao","doi":"10.1016/j.optlaseng.2025.109175","DOIUrl":null,"url":null,"abstract":"<div><div>When laser interferometry is applied to measure the topography of the helical surface, the interferogram is the only carrier of the measured morphology, and its quality is crucial for the measurement results. Due to the influence of many factors in actual measurement, the interferogram inevitably has geometric distortion, which leads to difficulty in subsequent image processing and even measurement failure. This paper proposes a comprehensive correction method for geometric distortion in the interferograms. Firstly, the sources of geometric distortion in the interferogram are analyzed, including geometric distortion from the measurement optical path and the optical component error. Secondly, a correction model is established combining the effects of component pose errors and lens distortion on the measurement results, and a six-parameter iterative algorithm is proposed to solve the optimal parameters of the model. Finally, the experiments are designed to verify that the corrected interferograms are closer to the standard images, which proves the feasibility of the proposed correction method.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"194 ","pages":"Article 109175"},"PeriodicalIF":3.5000,"publicationDate":"2025-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Geometric distortion correction of oblique incidence laser interferometer system for helical surface topography measurement\",\"authors\":\"Jinjing Zhang , Liping Lian , Pengcheng Yang , Mingyan Sun , Yin Zhang , Yuan Xiao\",\"doi\":\"10.1016/j.optlaseng.2025.109175\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>When laser interferometry is applied to measure the topography of the helical surface, the interferogram is the only carrier of the measured morphology, and its quality is crucial for the measurement results. Due to the influence of many factors in actual measurement, the interferogram inevitably has geometric distortion, which leads to difficulty in subsequent image processing and even measurement failure. This paper proposes a comprehensive correction method for geometric distortion in the interferograms. Firstly, the sources of geometric distortion in the interferogram are analyzed, including geometric distortion from the measurement optical path and the optical component error. Secondly, a correction model is established combining the effects of component pose errors and lens distortion on the measurement results, and a six-parameter iterative algorithm is proposed to solve the optimal parameters of the model. Finally, the experiments are designed to verify that the corrected interferograms are closer to the standard images, which proves the feasibility of the proposed correction method.</div></div>\",\"PeriodicalId\":49719,\"journal\":{\"name\":\"Optics and Lasers in Engineering\",\"volume\":\"194 \",\"pages\":\"Article 109175\"},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2025-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Lasers in Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0143816625003604\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Lasers in Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0143816625003604","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
Geometric distortion correction of oblique incidence laser interferometer system for helical surface topography measurement
When laser interferometry is applied to measure the topography of the helical surface, the interferogram is the only carrier of the measured morphology, and its quality is crucial for the measurement results. Due to the influence of many factors in actual measurement, the interferogram inevitably has geometric distortion, which leads to difficulty in subsequent image processing and even measurement failure. This paper proposes a comprehensive correction method for geometric distortion in the interferograms. Firstly, the sources of geometric distortion in the interferogram are analyzed, including geometric distortion from the measurement optical path and the optical component error. Secondly, a correction model is established combining the effects of component pose errors and lens distortion on the measurement results, and a six-parameter iterative algorithm is proposed to solve the optimal parameters of the model. Finally, the experiments are designed to verify that the corrected interferograms are closer to the standard images, which proves the feasibility of the proposed correction method.
期刊介绍:
Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods.
Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following:
-Optical Metrology-
Optical Methods for 3D visualization and virtual engineering-
Optical Techniques for Microsystems-
Imaging, Microscopy and Adaptive Optics-
Computational Imaging-
Laser methods in manufacturing-
Integrated optical and photonic sensors-
Optics and Photonics in Life Science-
Hyperspectral and spectroscopic methods-
Infrared and Terahertz techniques