Cai R. Ytsma , M. Darby Dyar , Kate Lepore , Jane C. Watts , Josephine L. King
{"title":"使用开源机器学习对1942年不同地质标准中28种元素的经验便携式x射线荧光定量限制和精度","authors":"Cai R. Ytsma , M. Darby Dyar , Kate Lepore , Jane C. Watts , Josephine L. King","doi":"10.1016/j.sab.2025.107241","DOIUrl":null,"url":null,"abstract":"<div><div>Portable X-Ray Fluorescence (pXRF) instruments are commonly used to quantify elements within materials due to their portability and quick results using a fundamental parameters approach and a data library. Results can also be customized by assembling alternative data libraries instead of the included calibrations that are typically provided with such systems. In contrast, this paper presents an alternate approach to the standard fundamental parameters (FP) protocol. We instead empirically quantify elemental abundances directly from pXRF spectra using multivariate (MVA) methods trained on 1942 geochemical standards. Prediction accuracies (RMSE-P) and limits of quantification (LOQ) are presented for six major (Al<sub>2</sub>O<sub>3</sub>, CaO, Fe<sub>2</sub>O<sub>3</sub>, MgO, SiO<sub>2</sub>, TiO<sub>2</sub>), two minor (MnO, P<sub>2</sub>O<sub>5</sub>), and 20 trace elements (As, Bi, Cr, Cu, Mo, Nb, Ni, Pb, Rb, SO<sub>3</sub>, Sn, Sr, Ta, Th, U, V, W, Y, Zn, Zr). Partial least squares (PLS) regression was chosen as the optimal MVA method from five other linear methods (ElasticNet, Ridge, OMP, PCR, LASSO). The resultant MVA models have accuracies comparable to instrument-based FP calibrations, and are more sensitive to low concentrations. This work demonstrates a powerful and adaptable open-source method for quantifying elements using XRF spectra that should be considered as a viable alternative to traditional FP approaches. The large and diverse geochemical dataset used here is made publicly available to encourage further study and combination of datasets with calibration transfer.</div></div>","PeriodicalId":21890,"journal":{"name":"Spectrochimica Acta Part B: Atomic Spectroscopy","volume":"231 ","pages":"Article 107241"},"PeriodicalIF":3.2000,"publicationDate":"2025-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Empirical portable x-ray fluorescence quantification limits and accuracies for 28 elements within 1942 diverse geological standards using open-source machine learning\",\"authors\":\"Cai R. Ytsma , M. Darby Dyar , Kate Lepore , Jane C. Watts , Josephine L. King\",\"doi\":\"10.1016/j.sab.2025.107241\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Portable X-Ray Fluorescence (pXRF) instruments are commonly used to quantify elements within materials due to their portability and quick results using a fundamental parameters approach and a data library. Results can also be customized by assembling alternative data libraries instead of the included calibrations that are typically provided with such systems. In contrast, this paper presents an alternate approach to the standard fundamental parameters (FP) protocol. We instead empirically quantify elemental abundances directly from pXRF spectra using multivariate (MVA) methods trained on 1942 geochemical standards. Prediction accuracies (RMSE-P) and limits of quantification (LOQ) are presented for six major (Al<sub>2</sub>O<sub>3</sub>, CaO, Fe<sub>2</sub>O<sub>3</sub>, MgO, SiO<sub>2</sub>, TiO<sub>2</sub>), two minor (MnO, P<sub>2</sub>O<sub>5</sub>), and 20 trace elements (As, Bi, Cr, Cu, Mo, Nb, Ni, Pb, Rb, SO<sub>3</sub>, Sn, Sr, Ta, Th, U, V, W, Y, Zn, Zr). Partial least squares (PLS) regression was chosen as the optimal MVA method from five other linear methods (ElasticNet, Ridge, OMP, PCR, LASSO). The resultant MVA models have accuracies comparable to instrument-based FP calibrations, and are more sensitive to low concentrations. This work demonstrates a powerful and adaptable open-source method for quantifying elements using XRF spectra that should be considered as a viable alternative to traditional FP approaches. The large and diverse geochemical dataset used here is made publicly available to encourage further study and combination of datasets with calibration transfer.</div></div>\",\"PeriodicalId\":21890,\"journal\":{\"name\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"volume\":\"231 \",\"pages\":\"Article 107241\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2025-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0584854725001260\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Spectrochimica Acta Part B: Atomic Spectroscopy","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0584854725001260","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
Empirical portable x-ray fluorescence quantification limits and accuracies for 28 elements within 1942 diverse geological standards using open-source machine learning
Portable X-Ray Fluorescence (pXRF) instruments are commonly used to quantify elements within materials due to their portability and quick results using a fundamental parameters approach and a data library. Results can also be customized by assembling alternative data libraries instead of the included calibrations that are typically provided with such systems. In contrast, this paper presents an alternate approach to the standard fundamental parameters (FP) protocol. We instead empirically quantify elemental abundances directly from pXRF spectra using multivariate (MVA) methods trained on 1942 geochemical standards. Prediction accuracies (RMSE-P) and limits of quantification (LOQ) are presented for six major (Al2O3, CaO, Fe2O3, MgO, SiO2, TiO2), two minor (MnO, P2O5), and 20 trace elements (As, Bi, Cr, Cu, Mo, Nb, Ni, Pb, Rb, SO3, Sn, Sr, Ta, Th, U, V, W, Y, Zn, Zr). Partial least squares (PLS) regression was chosen as the optimal MVA method from five other linear methods (ElasticNet, Ridge, OMP, PCR, LASSO). The resultant MVA models have accuracies comparable to instrument-based FP calibrations, and are more sensitive to low concentrations. This work demonstrates a powerful and adaptable open-source method for quantifying elements using XRF spectra that should be considered as a viable alternative to traditional FP approaches. The large and diverse geochemical dataset used here is made publicly available to encourage further study and combination of datasets with calibration transfer.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.