集成电路金属互连动态微孔充铜过程的实时可视化

IF 5.5 3区 材料科学 Q1 ELECTROCHEMISTRY
Jia-Qiang Yang, Tao Song, Zhao-Yun Wang, Lei Jin, Yi Zhao, Ren Hu, Jian-Jia Su, Fang-Zu Yang, Dongping Zhan, Lianhuan Han
{"title":"集成电路金属互连动态微孔充铜过程的实时可视化","authors":"Jia-Qiang Yang,&nbsp;Tao Song,&nbsp;Zhao-Yun Wang,&nbsp;Lei Jin,&nbsp;Yi Zhao,&nbsp;Ren Hu,&nbsp;Jian-Jia Su,&nbsp;Fang-Zu Yang,&nbsp;Dongping Zhan,&nbsp;Lianhuan Han","doi":"10.1016/j.electacta.2025.146698","DOIUrl":null,"url":null,"abstract":"<div><div>Metal Interconnection has been becoming the core technology in integrate circuit (IC) industry at post-Moore's law era from chip manufacturing through advanced 3D packaging to high density interconnection (HDI) of printed circuit boards (PCB), which is realized by electroplating copper (Cu) to fill the micro/nano-vias with various aspect ratio. However, the rational screening of Cu-electroplating additives remains challenges because there is no sufficient instrumental method for the real-time observation of the dynamic filling process. To this, we designed a visible electrolytic cell integrated with a microvia chip and recorded the dynamic microvia filling process in operando with a high-resolution video camera. The effects of suppressor, accelerator and leveler and the technique parameters were evaluated in a seeing-is-believing way, and were examined by the practical microvia filling experiments in PCB. This instrumental method, opens the “black box” of microvia filling process for metal interconnection, provides the most direct way for in-situ screening electroplating additives and will definitely facilitate the fundamental research and technical development of metal interconnection of IC manufacturing.</div></div>","PeriodicalId":305,"journal":{"name":"Electrochimica Acta","volume":"535 ","pages":"Article 146698"},"PeriodicalIF":5.5000,"publicationDate":"2025-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"In-operando visualization of the dynamic microvia copper filling process for metal interconnection of integrated circuit\",\"authors\":\"Jia-Qiang Yang,&nbsp;Tao Song,&nbsp;Zhao-Yun Wang,&nbsp;Lei Jin,&nbsp;Yi Zhao,&nbsp;Ren Hu,&nbsp;Jian-Jia Su,&nbsp;Fang-Zu Yang,&nbsp;Dongping Zhan,&nbsp;Lianhuan Han\",\"doi\":\"10.1016/j.electacta.2025.146698\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Metal Interconnection has been becoming the core technology in integrate circuit (IC) industry at post-Moore's law era from chip manufacturing through advanced 3D packaging to high density interconnection (HDI) of printed circuit boards (PCB), which is realized by electroplating copper (Cu) to fill the micro/nano-vias with various aspect ratio. However, the rational screening of Cu-electroplating additives remains challenges because there is no sufficient instrumental method for the real-time observation of the dynamic filling process. To this, we designed a visible electrolytic cell integrated with a microvia chip and recorded the dynamic microvia filling process in operando with a high-resolution video camera. The effects of suppressor, accelerator and leveler and the technique parameters were evaluated in a seeing-is-believing way, and were examined by the practical microvia filling experiments in PCB. This instrumental method, opens the “black box” of microvia filling process for metal interconnection, provides the most direct way for in-situ screening electroplating additives and will definitely facilitate the fundamental research and technical development of metal interconnection of IC manufacturing.</div></div>\",\"PeriodicalId\":305,\"journal\":{\"name\":\"Electrochimica Acta\",\"volume\":\"535 \",\"pages\":\"Article 146698\"},\"PeriodicalIF\":5.5000,\"publicationDate\":\"2025-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrochimica Acta\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S001346862501059X\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ELECTROCHEMISTRY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrochimica Acta","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S001346862501059X","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ELECTROCHEMISTRY","Score":null,"Total":0}
引用次数: 0

摘要

金属互连已成为后摩尔定律时代集成电路(IC)产业的核心技术,从先进的3D封装芯片制造到印刷电路板(PCB)的高密度互连(HDI),通过电镀铜(Cu)填充不同宽高比的微/纳米通孔来实现。然而,由于没有足够的仪器方法来实时观察动态填充过程,合理筛选镀铜添加剂仍然是一个挑战。为此,我们设计了一个集成微孔芯片的可见电解槽,并利用高分辨率摄像机记录了歌剧中微孔填充的动态过程。对抑制剂、加速剂和矫直剂的效果和工艺参数进行了目视评价,并通过实际的PCB微孔填充实验进行了检验。该仪器方法打开了金属互连微孔填充工艺的“黑匣子”,为电镀添加剂的原位筛选提供了最直接的途径,必将促进IC制造金属互连的基础研究和技术发展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
In-operando visualization of the dynamic microvia copper filling process for metal interconnection of integrated circuit
Metal Interconnection has been becoming the core technology in integrate circuit (IC) industry at post-Moore's law era from chip manufacturing through advanced 3D packaging to high density interconnection (HDI) of printed circuit boards (PCB), which is realized by electroplating copper (Cu) to fill the micro/nano-vias with various aspect ratio. However, the rational screening of Cu-electroplating additives remains challenges because there is no sufficient instrumental method for the real-time observation of the dynamic filling process. To this, we designed a visible electrolytic cell integrated with a microvia chip and recorded the dynamic microvia filling process in operando with a high-resolution video camera. The effects of suppressor, accelerator and leveler and the technique parameters were evaluated in a seeing-is-believing way, and were examined by the practical microvia filling experiments in PCB. This instrumental method, opens the “black box” of microvia filling process for metal interconnection, provides the most direct way for in-situ screening electroplating additives and will definitely facilitate the fundamental research and technical development of metal interconnection of IC manufacturing.
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来源期刊
Electrochimica Acta
Electrochimica Acta 工程技术-电化学
CiteScore
11.30
自引率
6.10%
发文量
1634
审稿时长
41 days
期刊介绍: Electrochimica Acta is an international journal. It is intended for the publication of both original work and reviews in the field of electrochemistry. Electrochemistry should be interpreted to mean any of the research fields covered by the Divisions of the International Society of Electrochemistry listed below, as well as emerging scientific domains covered by ISE New Topics Committee.
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