{"title":"基于光探针电流传感器的快速开关GaN器件的超微创电流测量","authors":"Satoshi Sue, Mitsunori Miyamoto, Toshiya Kubo, Makoto Sonehara, Toshiro Sato, Ryu Nagahama","doi":"10.1002/ecj.12491","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>Previously, the authors have proposed a contactless probe-type current sensor with low insertion impedance. In this paper, the insertion impedance of the proposed current sensor at high frequencies is clarified. Then, we measured the actual high-speed switching current flowing through a GaN device and compared the measured waveforms with those of a coaxial-type shunt resistor. Comparison of the measured waveforms showed that the coaxial shunt resistor exhibited ringing in the waveform due to the effect of insertion impedance, but the proposed current sensor exhibited less ringing, indicating that the measurement is minimally invasive to the circuit under test.</p>\n </div>","PeriodicalId":50539,"journal":{"name":"Electronics and Communications in Japan","volume":"108 2","pages":""},"PeriodicalIF":0.4000,"publicationDate":"2025-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ultra-Minimally Invasive Current Measurement in Fast Switching GaN Devices Using Optical Probe Current Sensor\",\"authors\":\"Satoshi Sue, Mitsunori Miyamoto, Toshiya Kubo, Makoto Sonehara, Toshiro Sato, Ryu Nagahama\",\"doi\":\"10.1002/ecj.12491\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div>\\n \\n <p>Previously, the authors have proposed a contactless probe-type current sensor with low insertion impedance. In this paper, the insertion impedance of the proposed current sensor at high frequencies is clarified. Then, we measured the actual high-speed switching current flowing through a GaN device and compared the measured waveforms with those of a coaxial-type shunt resistor. Comparison of the measured waveforms showed that the coaxial shunt resistor exhibited ringing in the waveform due to the effect of insertion impedance, but the proposed current sensor exhibited less ringing, indicating that the measurement is minimally invasive to the circuit under test.</p>\\n </div>\",\"PeriodicalId\":50539,\"journal\":{\"name\":\"Electronics and Communications in Japan\",\"volume\":\"108 2\",\"pages\":\"\"},\"PeriodicalIF\":0.4000,\"publicationDate\":\"2025-04-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electronics and Communications in Japan\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/ecj.12491\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronics and Communications in Japan","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/ecj.12491","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Ultra-Minimally Invasive Current Measurement in Fast Switching GaN Devices Using Optical Probe Current Sensor
Previously, the authors have proposed a contactless probe-type current sensor with low insertion impedance. In this paper, the insertion impedance of the proposed current sensor at high frequencies is clarified. Then, we measured the actual high-speed switching current flowing through a GaN device and compared the measured waveforms with those of a coaxial-type shunt resistor. Comparison of the measured waveforms showed that the coaxial shunt resistor exhibited ringing in the waveform due to the effect of insertion impedance, but the proposed current sensor exhibited less ringing, indicating that the measurement is minimally invasive to the circuit under test.
期刊介绍:
Electronics and Communications in Japan (ECJ) publishes papers translated from the Transactions of the Institute of Electrical Engineers of Japan 12 times per year as an official journal of the Institute of Electrical Engineers of Japan (IEEJ). ECJ aims to provide world-class researches in highly diverse and sophisticated areas of Electrical and Electronic Engineering as well as in related disciplines with emphasis on electronic circuits, controls and communications. ECJ focuses on the following fields:
- Electronic theory and circuits,
- Control theory,
- Communications,
- Cryptography,
- Biomedical fields,
- Surveillance,
- Robotics,
- Sensors and actuators,
- Micromachines,
- Image analysis and signal analysis,
- New materials.
For works related to the science, technology, and applications of electric power, please refer to the sister journal Electrical Engineering in Japan (EEJ).