基于全波长缝隙天线单元的毫米波广角波束扫描相控阵

IF 3.7 2区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Jianhong Zhai;Yunfei Cao;Wenjie Feng;Wenquan Che;Quan Xue
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引用次数: 0

摘要

宽扫描范围的相控阵对于增加毫米波通信信号覆盖具有重要意义。本文提出了一种基于交叉全波长缝隙元件的毫米波广角波束扫描相控阵。利用全波长缝隙元件的高增益特性来提高阵列的视轴增益。所提出的交叉槽天线单元具有一对镜面对称辐射全波长槽。交叉槽采用平行臂设计,以减小相控阵的元间距离。此外,在阵列外部元件附近加载寄生槽以增加元件波束宽度。由于毫米波阵列的单元间距小,外加单元的宽波束特性,大大提高了毫米波阵列的波束扫描角。仿真和实测结果表明,所设计的1 × 8相控阵在26.0 ~ 30.0 GHz范围内扫描角度为±80°,扫描损耗为4db。与其他相关工作相比,该阵列具有波束扫描范围宽、增益高、体积小等优点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Millimeter-Wave Wide-Angle Beam-Scanning Phased Array Based on Full-Wavelength Slot Antenna Elements
The phased array with wide scanning range is significant to increase signal coverage for millimeter-wave communication. In this letter, a millimeter-wave wide-angle beam-scanning phased array based on crossed full-wavelength slot elements is presented. High-gain performance of full-wavelength slot elements are used to improve the array boresight gain. The proposed crossed slot antenna element has a pair of mirror symmetrical radiating full-wavelength slots. The crossed slot is designed with parallel arms to reduce element-to-element distance for the phased array. Furthermore, parasitic slots are loaded in the vicinity of outer elements of the array to increase the element beamwidth. Due to small element spacing and wide-beam characteristic of outer elements, the beam-scanning angle of the millimeter-wave array is enhanced substantially. As a result, simulated and measured results show that the proposed 1 × 8 phased array has scanning angles of ±80° with 4 dB scan loss in 26.0 GHz to 30.0 GHz. Compared with other related works, the proposed array has wider beam-scanning range with high gain and compact size.
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来源期刊
CiteScore
8.00
自引率
9.50%
发文量
529
审稿时长
1.0 months
期刊介绍: IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.
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