Rotary Topological Defects in an Oscillator Lattice Loop and Their Injection Locked Properties

The lattice loop formed by adjacent coupling of tunnel diode LC oscillators has been shown to generate topological defects due to broken mirror symmetry, which rotate in the opposite direction to the rotating pulse. Leveraging the injection locking of the rotational dynamics of these topological defects can lead to a subharmonic injection locking scheme with a large division ratio. This paper aims to enhance the design by elucidating the relationship between loop size, the number of topological defects, and the division ratio. Furthermore, we perform bifurcation analysis of the injection locking system, demonstrating that when the external signal strength reaches a certain threshold, defect pinning by the external signal occurs, leading to an extension of the lock range. The dynamics of topological defects are well suited to the so-called progressive multiphase injection locking. In this paper, we clarify the degree of lock range extension achieved by introducing this technique.