Kang Li, Xiaoming Zha, Meng Huang, Rongjun Chen, Zhimin Lu
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Reliability Evaluation of MMC-MTDC System Considering Device Failure Rates and Multi-State Transition
The modular multi-level converter based multi-terminal high voltage direct current (MMC-MTDC) system, with its numerous power devices and diverse operating states, poses a significant challenge for reliability evaluation. The paper introduces a method for modeling and assessing the reliability of MMC-MTDC, considering both power device failure rates and multi-state transitions of multiple terminals. To determine the weights of influence, the analytic hierarchy process (AHP) is employed to evaluate the impact of sub-modules (SMs), the controller system, and the water cooling systems of an MMC. Subsequently, a multi-state transition model is established to describe the changes in the operation mode of the MMC-MTDC. On this basis, the reliability evaluation via semi-Markov processes is implemented. A case study is performed on the reliability of a ±200 kV five-terminal system and the results are compared with practical operation data.
期刊介绍：
The scope of the Journal comprises all aspects of the theory and design of analog and digital circuits together with the application of the ideas and techniques of circuit theory in other fields of science and engineering. Examples of the areas covered include: Fundamental Circuit Theory together with its mathematical and computational aspects; Circuit modeling of devices; Synthesis and design of filters and active circuits; Neural networks; Nonlinear and chaotic circuits; Signal processing and VLSI; Distributed, switched and digital circuits; Power electronics; Solid state devices. Contributions to CAD and simulation are welcome.
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