基于多个离散陷阱能级的双层油浸纸绝缘空间电荷模拟模型

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Meng Huang;Lu Wang;Zilu Wang;Shilonng Niu;Weiguang You;Bo Qi
{"title":"基于多个离散陷阱能级的双层油浸纸绝缘空间电荷模拟模型","authors":"Meng Huang;Lu Wang;Zilu Wang;Shilonng Niu;Weiguang You;Bo Qi","doi":"10.1109/TDEI.2024.3501999","DOIUrl":null,"url":null,"abstract":"Space charge-induced electric field distortion seriously threatens dielectric insulation properties. However, there are fewer simulation studies on the interfacial charge of the same dielectric structure, such as bilayer oil-impregnated paper. In this article, based on the bipolar carrier transport model, a multiple discrete trap energy levels carrier transport model is proposed to simulate the space charge distribution of the bilayer oil-impregnated paper structure, taking the fast charge migration process into account. The results show that the maximum error of charge distribution under positive and negative polarity applied voltage is about 7.42% and 3.93%, respectively, and the simulation results are in good agreement with the experimental results. The effect of relaxation polarization on the polarization current is analyzed, and the polarization current simulation values considering relaxation polarization agree well with the experimental values, with a maximum error of about 7.3%. We find that the fast charge migration process is the root cause and the main source of the interfacial charge accumulation of the same medium. The introduction of the fast migration process ensures that the polarity of the interfacial charge accumulation is the same as that of the semi-conducting electrode, and the interfacial charge peaks all have a tendency to shift from the semi-conducting electrode side to the metal electrode side. The study in this article can provide a mechanism explanation for characterizing the migration mechanism of bilayer oil-impregnated paper structure and the origin of interfacial charge accumulation.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"1442-1450"},"PeriodicalIF":2.9000,"publicationDate":"2024-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Space Charge Simulation Model for Bilayer Oil-Impregnated Paper Insulation Based on Multiple Discrete Trap Energy Levels\",\"authors\":\"Meng Huang;Lu Wang;Zilu Wang;Shilonng Niu;Weiguang You;Bo Qi\",\"doi\":\"10.1109/TDEI.2024.3501999\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Space charge-induced electric field distortion seriously threatens dielectric insulation properties. However, there are fewer simulation studies on the interfacial charge of the same dielectric structure, such as bilayer oil-impregnated paper. In this article, based on the bipolar carrier transport model, a multiple discrete trap energy levels carrier transport model is proposed to simulate the space charge distribution of the bilayer oil-impregnated paper structure, taking the fast charge migration process into account. The results show that the maximum error of charge distribution under positive and negative polarity applied voltage is about 7.42% and 3.93%, respectively, and the simulation results are in good agreement with the experimental results. The effect of relaxation polarization on the polarization current is analyzed, and the polarization current simulation values considering relaxation polarization agree well with the experimental values, with a maximum error of about 7.3%. We find that the fast charge migration process is the root cause and the main source of the interfacial charge accumulation of the same medium. The introduction of the fast migration process ensures that the polarity of the interfacial charge accumulation is the same as that of the semi-conducting electrode, and the interfacial charge peaks all have a tendency to shift from the semi-conducting electrode side to the metal electrode side. The study in this article can provide a mechanism explanation for characterizing the migration mechanism of bilayer oil-impregnated paper structure and the origin of interfacial charge accumulation.\",\"PeriodicalId\":13247,\"journal\":{\"name\":\"IEEE Transactions on Dielectrics and Electrical Insulation\",\"volume\":\"32 3\",\"pages\":\"1442-1450\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Dielectrics and Electrical Insulation\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10756714/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Dielectrics and Electrical Insulation","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10756714/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

空间电荷引起的电场畸变严重威胁着介质的绝缘性能。然而,对双层油浸纸等相同介质结构界面电荷的模拟研究较少。本文在双极载流子输运模型的基础上,考虑电荷快速迁移过程,提出了一种多离散陷阱能级载流子输运模型来模拟双层油浸纸结构的空间电荷分布。结果表明,在正、负极性外加电压下,电荷分布的最大误差分别为7.42%和3.93%,仿真结果与实验结果吻合较好。分析了弛豫极化对极化电流的影响,考虑弛豫极化的极化电流仿真值与实验值吻合较好,最大误差约为7.3%。研究发现,快速电荷迁移过程是同一介质界面电荷积累的根本原因和主要来源。快速迁移过程的引入保证了界面电荷积累的极性与半导体电极的极性相同,并且界面电荷峰都有从半导体电极侧向金属电极侧移动的趋势。本文的研究可以为表征双层油浸纸结构的迁移机理和界面电荷积聚的成因提供机理解释。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Space Charge Simulation Model for Bilayer Oil-Impregnated Paper Insulation Based on Multiple Discrete Trap Energy Levels
Space charge-induced electric field distortion seriously threatens dielectric insulation properties. However, there are fewer simulation studies on the interfacial charge of the same dielectric structure, such as bilayer oil-impregnated paper. In this article, based on the bipolar carrier transport model, a multiple discrete trap energy levels carrier transport model is proposed to simulate the space charge distribution of the bilayer oil-impregnated paper structure, taking the fast charge migration process into account. The results show that the maximum error of charge distribution under positive and negative polarity applied voltage is about 7.42% and 3.93%, respectively, and the simulation results are in good agreement with the experimental results. The effect of relaxation polarization on the polarization current is analyzed, and the polarization current simulation values considering relaxation polarization agree well with the experimental values, with a maximum error of about 7.3%. We find that the fast charge migration process is the root cause and the main source of the interfacial charge accumulation of the same medium. The introduction of the fast migration process ensures that the polarity of the interfacial charge accumulation is the same as that of the semi-conducting electrode, and the interfacial charge peaks all have a tendency to shift from the semi-conducting electrode side to the metal electrode side. The study in this article can provide a mechanism explanation for characterizing the migration mechanism of bilayer oil-impregnated paper structure and the origin of interfacial charge accumulation.
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
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