非随动倾斜-倾斜垂直梳状驱动微镜机械跨轴耦合研究

IF 3.1 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Yuhu Xia;Biyun Ling;Xiaoyue Wang;Yaming Wu
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引用次数: 0

摘要

本文详细地定量分析了垂直梳状驱动(VCD)微镜倾斜扫描时的机械交叉轴耦合问题。在提出的非随动(NFU) TT VCD微镜设计中,一组垂直梳(VCs)固定在布线基板上,而另一组垂直梳(VCs)可以随云台、弹簧和反射镜旋转。这种设计不仅提高了微镜阵列的制造可行性,而且为驱动信号扇出提供了方便。采用本体硅微加工的方法,在双绝缘体上硅(D-SOI)晶圆和中空铜(Cu)通硅孔(TSV)布线衬底上制备了该工艺。在此基础上,通过引入机械跨轴耦合因素,将与偏转相关的VC电容表达式代入TT扫描角解中,建立了机械跨轴耦合模型,以评估VCD作动器和系列弹簧对框架扫描结构的影响。计算表明,内轴旋转对外轴旋转的影响较小,而与VC电容计算的VC单元个数直接相关。计算结果与实测值也进行了比较,结果吻合较好。此外,我们还研究了该模型的解耦方法,以评估其双轴驱动电压估计的能力。此外,为了克服NFU TT扫描结构的缺陷,提出了一种简化的校准方法,作为该模型的扩展应用,既降低了校准工作量,又保证了TT扫描精度。(2024 - 0214)
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study on Mechanical Cross-Axis Coupling for Non-Follow-Up Tip-Tilt Vertical Comb-Drive Micromirror
This paper presents a quantitative analysis of mechanical cross-axis coupling in tip-tilt (TT) scanning of vertical comb-drive (VCD) micromirror in detail. In the proposed non-follow-up (NFU) TT VCD micromirror design, one set of vertical combs (VCs) is fixed on the wiring substrate, while the other VC set can rotate along with the gimbal, the springs, and the reflective mirror. Such design brings not only high fabrication feasibility but also convenience for driving signal fan-out of micromirror array (MMA). The fabrication process is adopted on a double-silicon-on-insulator (D-SOI) wafer and a hollow copper (Cu) through-silicon-via (TSV) wiring substrate through bulk silicon micromachining. Based on this, a mechanical cross-axis coupling model is developed by introducing mechanical cross-axis coupling factors and plugging the deflection-dependent VC capacitance expressions into TT scanning angle solution, in order to evaluate influence from VCD actuators and series springs of gimbaled scanning structure. The calculation indicates that inner-axis rotation has little influence on outer-axis rotation, while the opposite is in direct relation to the number of VC units that contribute to VC capacitance calculation. A comparison between calculation with measured results obtained from fabricated devices is also conducted, which shows a good agreement. Additionally, we have investigated the decoupling method of the proposed model to evaluate its capability of biaxial driving voltage estimation. Furthermore, to overcome the drawbacks of the NFU TT scanning structure, a simplified calibration methodology is proposed as the extended application of the proposed model, featuring both lowering calibration workload and guaranteeing TT scanning accuracy. [2024-0214]
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来源期刊
Journal of Microelectromechanical Systems
Journal of Microelectromechanical Systems 工程技术-工程:电子与电气
CiteScore
6.20
自引率
7.40%
发文量
115
审稿时长
7.5 months
期刊介绍: The topics of interest include, but are not limited to: devices ranging in size from microns to millimeters, IC-compatible fabrication techniques, other fabrication techniques, measurement of micro phenomena, theoretical results, new materials and designs, micro actuators, micro robots, micro batteries, bearings, wear, reliability, electrical interconnections, micro telemanipulation, and standards appropriate to MEMS. Application examples and application oriented devices in fluidics, optics, bio-medical engineering, etc., are also of central interest.
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