自由燃烧电弧对环保绝缘气体的老化:技术空气

IF 2.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Arik Subhana;Nina Sasaki Støa-Aanensen;Cédric Lesaint;Marte Gammelsæter;Frank Mauseth
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引用次数: 0

摘要

本文研究了在1.3 bar绝对压力下,自由燃烧电弧老化对技术空气(79% N2和21% O2)介电性能和化学成分的影响。老化是通过将气体暴露在一系列电弧中,消耗累积能量超过300 kJ(相当于中压(MV)负载断开开关的相关电弧能量)来完成的。为了评估长期介电性能,在老化前后10 mm的棒面间隙内进行了雷电冲击(LI)和工频交流击穿试验。气相色谱-质谱联用(GC-MS)也对气体分解进行了研究。结果表明,电弧后空气的LI击穿电压会暂时升高。这可能是由于短寿命空气副产物(如NO、NO2、NO3和O3)的形成可能减少初始电子生成。然而,交流击穿电压的变化可能不是那么显著,因为在后一种情况下,初级电子的存在可能得到保证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Aging of Environmentally Friendly Insulation Gases by Free-Burning Arcs: Technical Air
This article investigates the effect of aging due to free-burning arcs on the dielectric performance and the chemical composition of technical air (79% N2 and 21% O2) at 1.3-bar absolute pressure. The aging is performed by exposing the gas to a series of arcs dissipating an accumulated energy of more than 300 kJ, a level corresponding to relevant arcing energies for medium-voltage (MV) load break switches. To evaluate the long-term dielectric performance, lightning impulse (LI) and power frequency AC breakdown tests are conducted in a 10-mm rod–plane gap before and after aging. Gas decomposition is also investigated with gas chromatography coupled with mass spectrometry (GC–MS). Results indicate that the LI breakdown voltage of air may enhance temporarily after arcing. This is probably due to the formation of short-lived air byproducts (e.g., NO, NO2, NO3, and O3) which may reduce initial electron generation. However, changes in AC breakdown voltage might not be that significant as the presence of primary electrons is presumably guaranteed in the latter case.
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来源期刊
IEEE Transactions on Dielectrics and Electrical Insulation
IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程:电子与电气
CiteScore
6.00
自引率
22.60%
发文量
309
审稿时长
5.2 months
期刊介绍: Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.
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