熔盐法制备NaY(WO4)2:Er3+/Yb3+的纯绿色上转换发光及感温

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Meiling Li, Yongze Cao, Lihong Cheng, Yuhan Fan, Yichao Wang, Xiangping Li, Xizhen Zhang, Baojiu Chen
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引用次数: 0

摘要

以Na2SO4为溶剂,采用熔盐合成(MSS)法制备了Er3+/Yb3+共掺杂的NaY(WO4)2 (NYWO)荧光粉。保温温度、保温时间和溶剂-溶质质量比参数均可调节。采用XRD、SEM和荧光光谱仪对样品的结构、形貌和发光性能进行了测试。在980 nm激光激发下,在900℃、溶剂与溶质之比为3的条件下,制备了5 h的片层状样品,获得了最高的纯绿色上转换发光强度。结果表明,MSS制备的样品的UCL强度高于固体烧结样品。最大绝对灵敏度(SA)和相对灵敏度(SR)分别为0.012184 K -毒血症(507 K)和0.01102 K -毒血症(303 K)。这些材料可用于纯绿色发光显示器和温度传感。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pure green upconversion luminescence and temperature sensing of NaY(WO4)2:Er3+/Yb3+ prepared by molten salt method

A series of Er3+/Yb3+ co-doped NaY(WO4)2 (NYWO) phosphors are prepared by molten salt synthesis (MSS) with Na2SO4 as solvent. The holding temperature, holding time, and solvent-to-solute mass ratio parameters are regulated. The structure, morphology, and luminescence properties of the samples were tested by XRD, SEM, and fluorescence spectrometers, respectively. The lamellar sample is prepared at 900℃ for 5 h when solvent-to-solute is 3, which has the highest pure green upconversion luminescence (UCL) intensity under 980 nm laser excitation. It is demonstrated that the UCL intensity of the samples prepared by MSS is higher than that of solid sintered samples. The maximum absolute sensitivity (SA) and relative sensitivity (SR) are 0.012184 K⁻1 at 507 K and 0.01102 K⁻1 at 303 K, respectively. These materials can be used for pure green luminescence displays and temperature sensing.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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