M. S. Nisha, Cassandra Baptista, D. Praveen Sam, P. Senthil Kumar, S. Mullai Venthan, Gayathri Rangasamy
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Green cockpit engineering: harnessing natural fibers for electromagnetic compatibility
Electromagnetic interference (EMI) is a critical concern in the aviation industry as it has the potential to disrupt equipment. To mitigate this situation, research on microwave absorption materials becomes crucial. The primary objective of the study is to synthesize a composite material through a hydrothermal process, combining polyaniline (emeraldine salt) composite (20 wt % polyaniline on carbon black) (PANI) with reduced graphene oxide (rGO) which is then incorporated into a natural fiber matrix. Incorporation of this material improves the microwave radiation absorption capabilities of aircraft cockpits. To characterize prepared composite materials, X-ray diffraction (XRD), Scanning electron microscopy (SEM) and Energy Dispersive X-Ray Analysis have been used. Furthermore, to assess electromagnetic properties, the Dielectric Probe kit via a microwave analyzer has been used, and this has played a crucial role in microwave absorption tests, analyzing parameters such as reflection loss. Additionally, the dielectric probe test has determined the electrical and magnetic properties of materials, elucidating their dielectric constant, loss tangent, and magnetic permeability. These comprehensive analyses have aided in developing materials that effectively mitigate the impact of electromagnetic interference on aircraft electronics.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.