{"title":"基于深度学习的边信道分析中标签相关性的优化","authors":"Shengcheng Xia, Lang Li, Yu Ou, Jiahao Xiang","doi":"10.1016/j.mejo.2025.106721","DOIUrl":null,"url":null,"abstract":"<div><div>Label distribution learning techniques can significantly enhance the effectiveness of side-channel analysis. However, this method relies on using probability density functions to estimate the relationships between labels. The settings of parameters play a crucial role in the impact of the attacks. This study introduces a non-parametric statistical method to calculate the distribution between labels, specifically employing smoothing with the Gaussian kernel function and adjusting bandwidth. Then, the aggregation of the results from each label processed by the Gaussian kernel facilitates a hypothesis-free estimation of the label distribution. This method accurately represents the actual leakage distribution, speeding up guess entropy convergence. Secondly, we exploit similarities between profiling traces, proposing an analysis scheme for sample correlation locally of label distribution learning. Furthermore, Signal to-Noise Ratio (SNR) is employed to re-extract and reduce dataset dimensions to 500 power consumption points, resulting in noise reduction. Our results showcase the successful training of 800 profiling traces using our method for sample correlation locally of label distribution learning, with the findings indicating its exceptional performance.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"162 ","pages":"Article 106721"},"PeriodicalIF":1.9000,"publicationDate":"2025-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optimizing label correlation in deep learning-based side-channel analysis\",\"authors\":\"Shengcheng Xia, Lang Li, Yu Ou, Jiahao Xiang\",\"doi\":\"10.1016/j.mejo.2025.106721\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Label distribution learning techniques can significantly enhance the effectiveness of side-channel analysis. However, this method relies on using probability density functions to estimate the relationships between labels. The settings of parameters play a crucial role in the impact of the attacks. This study introduces a non-parametric statistical method to calculate the distribution between labels, specifically employing smoothing with the Gaussian kernel function and adjusting bandwidth. Then, the aggregation of the results from each label processed by the Gaussian kernel facilitates a hypothesis-free estimation of the label distribution. This method accurately represents the actual leakage distribution, speeding up guess entropy convergence. Secondly, we exploit similarities between profiling traces, proposing an analysis scheme for sample correlation locally of label distribution learning. Furthermore, Signal to-Noise Ratio (SNR) is employed to re-extract and reduce dataset dimensions to 500 power consumption points, resulting in noise reduction. Our results showcase the successful training of 800 profiling traces using our method for sample correlation locally of label distribution learning, with the findings indicating its exceptional performance.</div></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":\"162 \",\"pages\":\"Article 106721\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1879239125001705\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239125001705","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Optimizing label correlation in deep learning-based side-channel analysis
Label distribution learning techniques can significantly enhance the effectiveness of side-channel analysis. However, this method relies on using probability density functions to estimate the relationships between labels. The settings of parameters play a crucial role in the impact of the attacks. This study introduces a non-parametric statistical method to calculate the distribution between labels, specifically employing smoothing with the Gaussian kernel function and adjusting bandwidth. Then, the aggregation of the results from each label processed by the Gaussian kernel facilitates a hypothesis-free estimation of the label distribution. This method accurately represents the actual leakage distribution, speeding up guess entropy convergence. Secondly, we exploit similarities between profiling traces, proposing an analysis scheme for sample correlation locally of label distribution learning. Furthermore, Signal to-Noise Ratio (SNR) is employed to re-extract and reduce dataset dimensions to 500 power consumption points, resulting in noise reduction. Our results showcase the successful training of 800 profiling traces using our method for sample correlation locally of label distribution learning, with the findings indicating its exceptional performance.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.